Development of Q-band X-mode microwave reflectometry for the measurement of edge density profile
Z. Yang, Q. Cai, R. Zhou, H. Zhou, Z. Zhang, X. Pan and X. Ren
Institute of Physics Publishing (IOP)
Published 2018
Institute of Physics Publishing (IOP)
Published 2018
| Publication Date: |
2018-08-01
|
|---|---|
| Publisher: |
Institute of Physics Publishing (IOP)
|
| Electronic ISSN: |
1748-0221
|
| Topics: |
Physics
|
| Published by: |