Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System

M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
American Physical Society (APS)
Published 2018
Publication Date:
2018-07-18
Publisher:
American Physical Society (APS)
Print ISSN:
0031-9007
Electronic ISSN:
1079-7114
Topics:
Physics
Keywords:
Condensed Matter: Structure, etc.
Published by:
_version_ 1836399008930594816
autor M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
beschreibung Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018
citation_standardnr 6305916
datenlieferant ipn_articles
feed_id 52535
feed_publisher American Physical Society (APS)
feed_publisher_url http://www.aps.org/
insertion_date 2018-07-18
journaleissn 1079-7114
journalissn 0031-9007
publikationsjahr_anzeige 2018
publikationsjahr_facette 2018
publikationsjahr_intervall 7984:2015-2019
publikationsjahr_sort 2018
publisher American Physical Society (APS)
quelle Physical Review Letters
relation http://link.aps.org/doi/10.1103/PhysRevLett.121.035502
schlagwort Condensed Matter: Structure, etc.
search_space articles
shingle_author_1 M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
shingle_author_2 M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
shingle_author_3 M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
shingle_author_4 M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
shingle_catch_all_1 Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
Condensed Matter: Structure, etc.
Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018
M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
American Physical Society (APS)
0031-9007
00319007
1079-7114
10797114
shingle_catch_all_2 Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
Condensed Matter: Structure, etc.
Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018
M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
American Physical Society (APS)
0031-9007
00319007
1079-7114
10797114
shingle_catch_all_3 Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
Condensed Matter: Structure, etc.
Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018
M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
American Physical Society (APS)
0031-9007
00319007
1079-7114
10797114
shingle_catch_all_4 Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
Condensed Matter: Structure, etc.
Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018
M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
American Physical Society (APS)
0031-9007
00319007
1079-7114
10797114
shingle_title_1 Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
shingle_title_2 Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
shingle_title_3 Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
shingle_title_4 Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
timestamp 2025-06-30T23:36:08.653Z
titel Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
titel_suche Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
topic U
uid ipn_articles_6305916