Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System
M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan
American Physical Society (APS)
Published 2018
American Physical Society (APS)
Published 2018
Publication Date: |
2018-07-18
|
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Publisher: |
American Physical Society (APS)
|
Print ISSN: |
0031-9007
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Electronic ISSN: |
1079-7114
|
Topics: |
Physics
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Keywords: |
Condensed Matter: Structure, etc.
|
Published by: |
_version_ | 1836399008930594816 |
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autor | M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan |
beschreibung | Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018 |
citation_standardnr | 6305916 |
datenlieferant | ipn_articles |
feed_id | 52535 |
feed_publisher | American Physical Society (APS) |
feed_publisher_url | http://www.aps.org/ |
insertion_date | 2018-07-18 |
journaleissn | 1079-7114 |
journalissn | 0031-9007 |
publikationsjahr_anzeige | 2018 |
publikationsjahr_facette | 2018 |
publikationsjahr_intervall | 7984:2015-2019 |
publikationsjahr_sort | 2018 |
publisher | American Physical Society (APS) |
quelle | Physical Review Letters |
relation | http://link.aps.org/doi/10.1103/PhysRevLett.121.035502 |
schlagwort | Condensed Matter: Structure, etc. |
search_space | articles |
shingle_author_1 | M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan |
shingle_author_2 | M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan |
shingle_author_3 | M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan |
shingle_author_4 | M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan |
shingle_catch_all_1 | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System Condensed Matter: Structure, etc. Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018 M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan American Physical Society (APS) 0031-9007 00319007 1079-7114 10797114 |
shingle_catch_all_2 | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System Condensed Matter: Structure, etc. Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018 M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan American Physical Society (APS) 0031-9007 00319007 1079-7114 10797114 |
shingle_catch_all_3 | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System Condensed Matter: Structure, etc. Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018 M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan American Physical Society (APS) 0031-9007 00319007 1079-7114 10797114 |
shingle_catch_all_4 | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System Condensed Matter: Structure, etc. Author(s): M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan We measured the electromagnetic stress-induced local strain distribution on a centimeter-sized parallel-plate metallic resonant unit illuminated with microwave radiation. Using a fiber interferometer, we found that the strain changes sign across the resonant unit, in agreement with theoretical predi... [Phys. Rev. Lett. 121, 035502] Published Tue Jul 17, 2018 M. Wang, S. Wang, Q. Zhang, C. T. Chan, and H. B. Chan American Physical Society (APS) 0031-9007 00319007 1079-7114 10797114 |
shingle_title_1 | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System |
shingle_title_2 | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System |
shingle_title_3 | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System |
shingle_title_4 | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System |
timestamp | 2025-06-30T23:36:08.653Z |
titel | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System |
titel_suche | Measurement of Mechanical Deformations Induced by Enhanced Electromagnetic Stress on a Parallel Metallic-Plate System |
topic | U |
uid | ipn_articles_6305916 |