Characterization of Interfacial Structure in Polymer-Fullerene Bulk Heterojunctions via $^{13}\mathrm{C}$ ${^{2}\mathrm{H}}$ Rotational Echo Double Resonance NMR
R. C. Nieuwendaal, D. M. De; Longchamp, L. J. Richter, C. R. Snyder, R. L. Jones, S. Engmann, A. Herzing, M. Heeney, Z. Fei, A. B. Sieval, and J. C. Hummelen
American Physical Society (APS)
Published 2018
American Physical Society (APS)
Published 2018
| Publication Date: |
2018-07-14
|
|---|---|
| Publisher: |
American Physical Society (APS)
|
| Print ISSN: |
0031-9007
|
| Electronic ISSN: |
1079-7114
|
| Topics: |
Physics
|
| Keywords: |
Condensed Matter: Structure, etc.
|
| Published by: |