Reliability Analysis of Sealing Structure of Electromechanical System Based on Kriging Model

F Zhang, Y M Wang, R W Chen, W W Deng and Y Gao
Institute of Physics (IOP)
Published 2018
Publication Date:
2018-05-17
Publisher:
Institute of Physics (IOP)
Print ISSN:
1757-8981
Electronic ISSN:
1757-899X
Topics:
Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision Mechanics
Published by: