Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface

Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
American Association for the Advancement of Science (AAAS)
Published 2018
Publication Date:
2018-03-17
Publisher:
American Association for the Advancement of Science (AAAS)
Electronic ISSN:
2375-2548
Topics:
Natural Sciences in General
Published by:
_version_ 1836398850886074368
autor Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
beschreibung The exact mechanism responsible for the significant enhancement of the superconducting transition temperature ( T c ) of monolayer iron selenide (FeSe) films on SrTiO 3 (STO) over that of bulk FeSe is an open issue. We present the results of a coordinated study of electrical transport, low temperature electron energy-loss spectroscopy (EELS), and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) measurements on FeSe/STO films of different thicknesses. HAADF-STEM imaging together with EELS mapping across the FeSe/STO interface shows direct evidence of electrons transferred from STO to the FeSe layer. The transferred electrons were found to accumulate within the first two atomic layers of the FeSe films near the STO substrate. An additional Se layer is also resolved to reside between the FeSe film and the TiO x -terminated STO substrate. Our transport results found that a positive backgate applied from STO is particularly effective in enhancing T c of the films while minimally changing the carrier density. This increase in T c is due to the positive backgate that "pulls" the transferred electrons in FeSe films closer to the interface and thus enhances their coupling to interfacial phonons and also the electron-electron interaction within FeSe films.
citation_standardnr 6209977
datenlieferant ipn_articles
feed_id 228416
feed_publisher American Association for the Advancement of Science (AAAS)
feed_publisher_url http://www.aaas.org/
insertion_date 2018-03-17
journaleissn 2375-2548
publikationsjahr_anzeige 2018
publikationsjahr_facette 2018
publikationsjahr_intervall 7984:2015-2019
publikationsjahr_sort 2018
publisher American Association for the Advancement of Science (AAAS)
quelle Science Advances
relation http://advances.sciencemag.org/cgi/content/short/4/3/eaao2682?rss=1
search_space articles
shingle_author_1 Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
shingle_author_2 Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
shingle_author_3 Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
shingle_author_4 Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
shingle_catch_all_1 Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
The exact mechanism responsible for the significant enhancement of the superconducting transition temperature ( T c ) of monolayer iron selenide (FeSe) films on SrTiO 3 (STO) over that of bulk FeSe is an open issue. We present the results of a coordinated study of electrical transport, low temperature electron energy-loss spectroscopy (EELS), and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) measurements on FeSe/STO films of different thicknesses. HAADF-STEM imaging together with EELS mapping across the FeSe/STO interface shows direct evidence of electrons transferred from STO to the FeSe layer. The transferred electrons were found to accumulate within the first two atomic layers of the FeSe films near the STO substrate. An additional Se layer is also resolved to reside between the FeSe film and the TiO x -terminated STO substrate. Our transport results found that a positive backgate applied from STO is particularly effective in enhancing T c of the films while minimally changing the carrier density. This increase in T c is due to the positive backgate that "pulls" the transferred electrons in FeSe films closer to the interface and thus enhances their coupling to interfacial phonons and also the electron-electron interaction within FeSe films.
Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
American Association for the Advancement of Science (AAAS)
2375-2548
23752548
shingle_catch_all_2 Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
The exact mechanism responsible for the significant enhancement of the superconducting transition temperature ( T c ) of monolayer iron selenide (FeSe) films on SrTiO 3 (STO) over that of bulk FeSe is an open issue. We present the results of a coordinated study of electrical transport, low temperature electron energy-loss spectroscopy (EELS), and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) measurements on FeSe/STO films of different thicknesses. HAADF-STEM imaging together with EELS mapping across the FeSe/STO interface shows direct evidence of electrons transferred from STO to the FeSe layer. The transferred electrons were found to accumulate within the first two atomic layers of the FeSe films near the STO substrate. An additional Se layer is also resolved to reside between the FeSe film and the TiO x -terminated STO substrate. Our transport results found that a positive backgate applied from STO is particularly effective in enhancing T c of the films while minimally changing the carrier density. This increase in T c is due to the positive backgate that "pulls" the transferred electrons in FeSe films closer to the interface and thus enhances their coupling to interfacial phonons and also the electron-electron interaction within FeSe films.
Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
American Association for the Advancement of Science (AAAS)
2375-2548
23752548
shingle_catch_all_3 Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
The exact mechanism responsible for the significant enhancement of the superconducting transition temperature ( T c ) of monolayer iron selenide (FeSe) films on SrTiO 3 (STO) over that of bulk FeSe is an open issue. We present the results of a coordinated study of electrical transport, low temperature electron energy-loss spectroscopy (EELS), and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) measurements on FeSe/STO films of different thicknesses. HAADF-STEM imaging together with EELS mapping across the FeSe/STO interface shows direct evidence of electrons transferred from STO to the FeSe layer. The transferred electrons were found to accumulate within the first two atomic layers of the FeSe films near the STO substrate. An additional Se layer is also resolved to reside between the FeSe film and the TiO x -terminated STO substrate. Our transport results found that a positive backgate applied from STO is particularly effective in enhancing T c of the films while minimally changing the carrier density. This increase in T c is due to the positive backgate that "pulls" the transferred electrons in FeSe films closer to the interface and thus enhances their coupling to interfacial phonons and also the electron-electron interaction within FeSe films.
Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
American Association for the Advancement of Science (AAAS)
2375-2548
23752548
shingle_catch_all_4 Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
The exact mechanism responsible for the significant enhancement of the superconducting transition temperature ( T c ) of monolayer iron selenide (FeSe) films on SrTiO 3 (STO) over that of bulk FeSe is an open issue. We present the results of a coordinated study of electrical transport, low temperature electron energy-loss spectroscopy (EELS), and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) measurements on FeSe/STO films of different thicknesses. HAADF-STEM imaging together with EELS mapping across the FeSe/STO interface shows direct evidence of electrons transferred from STO to the FeSe layer. The transferred electrons were found to accumulate within the first two atomic layers of the FeSe films near the STO substrate. An additional Se layer is also resolved to reside between the FeSe film and the TiO x -terminated STO substrate. Our transport results found that a positive backgate applied from STO is particularly effective in enhancing T c of the films while minimally changing the carrier density. This increase in T c is due to the positive backgate that "pulls" the transferred electrons in FeSe films closer to the interface and thus enhances their coupling to interfacial phonons and also the electron-electron interaction within FeSe films.
Zhao, W., Li, M., Chang, C.-Z., Jiang, J., Wu, L., Liu, C., Moodera, J. S., Zhu, Y., Chan, M. H. W.
American Association for the Advancement of Science (AAAS)
2375-2548
23752548
shingle_title_1 Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
shingle_title_2 Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
shingle_title_3 Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
shingle_title_4 Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
timestamp 2025-06-30T23:33:38.666Z
titel Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
titel_suche Direct imaging of electron transfer and its influence on superconducting pairing at FeSe/SrTiO3 interface
topic TA-TD
uid ipn_articles_6209977