Search Results - (Author, Cooperation:W. J. Ong)

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    Ong, W. J. ; Tok, E. S.

    Woodbury, NY : American Institute of Physics (AIP)
    Published 2002
    Staff View
    ISSN:
    1077-3118
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    Scanning tunneling microscopy (STM) and x-ray photoelectron spectroscopy (XPS) were used to observe the formation of metastable (6×6)-Si nanoclusters (diameter ∼16.5±0.1 A) on 6H–SiC(0001)-(3×3) surface. STM and XPS data suggest that these clusters are derived from the ejection of the Si-tetracluster unit of the initial (3×3) reconstruction at elevated temperatures and occur in a less Si-rich environment than the initial surface. The observed surface restructuring is related to the reconfiguration of coplanar Si bonds within the (3×3) unit cell. The occurrence of these regularly sized "magic" clusters demonstrates the potential of nanostructure formation of Si on SiC. © 2002 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    Articles: DFG German National Licenses
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    Ong, W. J. 〈SJ〉

    Woodstock, Md., etc : Periodicals Archive Online (PAO)
    Published 1960
    Articles: DFG German National Licenses
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    Articles: DFG German National Licenses
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    ONG, W. J.

    Paris : Periodicals Archive Online (PAO)
    Published 1954
    Staff View
    ISSN:
    0035-1466
    Topics:
    Linguistics and Literary Studies
    Notes:
    Notes et Documents
    URL:
    Articles: DFG German National Licenses