Search Results - (Author, Cooperation:T. Pritchard)
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1A. Maselli ; A. Melandri ; L. Nava ; C. G. Mundell ; N. Kawai ; S. Campana ; S. Covino ; J. R. Cummings ; G. Cusumano ; P. A. Evans ; G. Ghirlanda ; G. Ghisellini ; C. Guidorzi ; S. Kobayashi ; P. Kuin ; V. La Parola ; V. Mangano ; S. Oates ; T. Sakamoto ; M. Serino ; F. Virgili ; B. B. Zhang ; S. Barthelmy ; A. Beardmore ; M. G. Bernardini ; D. Bersier ; D. Burrows ; G. Calderone ; M. Capalbi ; J. Chiang ; P. D'Avanzo ; V. D'Elia ; M. De Pasquale ; D. Fugazza ; N. Gehrels ; A. Gomboc ; R. Harrison ; H. Hanayama ; J. Japelj ; J. Kennea ; D. Kopac ; C. Kouveliotou ; D. Kuroda ; A. Levan ; D. Malesani ; F. Marshall ; J. Nousek ; P. O'Brien ; J. P. Osborne ; C. Pagani ; K. L. Page ; M. Page ; M. Perri ; T. Pritchard ; P. Romano ; Y. Saito ; B. Sbarufatti ; R. Salvaterra ; I. Steele ; N. Tanvir ; G. Vianello ; B. Wiegand ; K. Wiersema ; Y. Yatsu ; T. Yoshii ; G. Tagliaferri
American Association for the Advancement of Science (AAAS)
Published 2013Staff ViewPublication Date: 2013-11-23Publisher: American Association for the Advancement of Science (AAAS)Print ISSN: 0036-8075Electronic ISSN: 1095-9203Topics: BiologyChemistry and PharmacologyComputer ScienceMedicineNatural Sciences in GeneralPhysicsPublished by: -
2Harry A. T. Pritchard, Paulo W. Pires, Evan Yamasaki, Pratish Thakore, Scott Earley
National Academy of Sciences
Published 2018Staff ViewPublication Date: 2018-10-10Publisher: National Academy of SciencesPrint ISSN: 0027-8424Electronic ISSN: 1091-6490Topics: BiologyMedicineNatural Sciences in GeneralPublished by: -
3Staff View
ISSN: 0308-597XSource: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002Topics: Energy, Environment Protection, Nuclear Power EngineeringAgriculture, Forestry, Horticulture, Fishery, Domestic Science, NutritionPolitical ScienceLawType of Medium: Electronic ResourceURL: -
4Staff View
ISSN: 0042-207XSource: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsPhysicsType of Medium: Electronic ResourceURL: -
5Staff View
ISSN: 0036-9241Topics: HistoryNotes: ReviewsURL: -
6Staff View
ISSN: 1573-1979Keywords: mixed-signal test ; transient response analysis ; filters ; correlationSource: Springer Online Journal Archives 1860-2000Topics: Electrical Engineering, Measurement and Control TechnologyNotes: Abstract Transient Response Testing (TRT) has been shown to be a viable technique for determining the functionality of a linear circuit element [1] [2] [3] [4]. The impulse response of a linear network can be used to generate a single measurement, termed the Index of Functionality (I F ) which is an absolute measurement of device functionality. Analysis is performed in the time domain and pass/fail decisions are made entirely on the strength of this single measurement. Currently there is a problem in that this measurement is dominated by the DC content of the transient responses being compared and setting functional pass/fail limits is therefore very difficult. Small DC discrepancies are quite common in observed responses but are usually due to losses in signal paths when a response is multiplexed off-chip, simulation/modelling difficulties, power supply variations or tester intrusion. Further refinements of this measurement technique, resulting in two new measurements (I F AC andI F LR ) which are and insensitive to DC signal variations, and therefore provide increased AC sensitivity, are also presented and the techniques contrasted.Type of Medium: Electronic ResourceURL: -
7Staff View
ISSN: 1573-0727Keywords: ADCs ; histogram ; FFT ; optimization ; embeddedSource: Springer Online Journal Archives 1860-2000Topics: Electrical Engineering, Measurement and Control TechnologyNotes: Abstract A novel data optimization test technique is presented which utilizes a BIST structure, an ADC model and histogram data to characterize embedded ADCs. A practical 8 bit ADC is modeled and then characterized using 20% less data points then conventional analysis with a 78% reduction in the amount of data required to be shifted off-chip. Comparisons between theoretical, modeled and practical results are also made in the paper.Type of Medium: Electronic ResourceURL: