Search Results - (Author, Cooperation:T. Heller)
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1Latest Papers from Table of Contents or Articles in PressH. S. Kuehn ; W. Ouyang ; B. Lo ; E. K. Deenick ; J. E. Niemela ; D. T. Avery ; J. N. Schickel ; D. Q. Tran ; J. Stoddard ; Y. Zhang ; D. M. Frucht ; B. Dumitriu ; P. Scheinberg ; L. R. Folio ; C. A. Frein ; S. Price ; C. Koh ; T. Heller ; C. M. Seroogy ; A. Huttenlocher ; V. K. Rao ; H. C. Su ; D. Kleiner ; L. D. Notarangelo ; Y. Rampertaap ; K. N. Olivier ; J. McElwee ; J. Hughes ; S. Pittaluga ; J. B. Oliveira ; E. Meffre ; T. A. Fleisher ; S. M. Holland ; M. J. Lenardo ; S. G. Tangye ; G. Uzel
American Association for the Advancement of Science (AAAS)
Published 2014Staff ViewPublication Date: 2014-09-13Publisher: American Association for the Advancement of Science (AAAS)Print ISSN: 0036-8075Electronic ISSN: 1095-9203Topics: BiologyChemistry and PharmacologyComputer ScienceMedicineNatural Sciences in GeneralPhysicsKeywords: Adult ; Animals ; B-Lymphocytes/immunology ; CTLA-4 Antigen/*genetics ; Female ; Forkhead Transcription Factors/immunology ; *Germ-Line Mutation ; *Haploinsufficiency ; Humans ; Immune System Diseases/*genetics ; Immunity/*genetics ; Male ; Mice ; Mice, Mutant Strains ; Pedigree ; T-Lymphocytes, Regulatory/immunology ; Young AdultPublished by: -
2Articles: DFG German National LicensesStaff View
ISSN: 0022-0965Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002Topics: PsychologyType of Medium: Electronic ResourceURL: -
3Articles: DFG German National LicensesStaff View
ISSN: 0270-3092Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002Topics: MedicinePsychologyType of Medium: Electronic ResourceURL: -
4Articles: DFG German National LicensesHigh mass resolution time-of-flight secondary ion mass spectrometry. Application to peak assignmentsNiehuis, E. ; Van Velzen, P. N. T. ; Lub, J. ; Heller, T. ; Benninghoven, A.
Chichester [u.a.] : Wiley-Blackwell
Published 1989Staff ViewISSN: 0142-2421Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: PhysicsNotes: The negative time-of-flight secondary ion mass spectrometry spectrum of a trimethylsilylated silicon oxide surface and positive ion spectra of polymethylmethacrylate (PMMA) surfaces before and after treatment with an oxygen plasma are presented. The spectra were recorded with a SIMS spectrometer equipped with a Reflectron-type mass analyser. This instrument exhibits a mass resolution high enough to be able to determine the chemical composition of the secondary ions directly from the spectra and to resolve peaks of oxygen and non-oxygen-containing ions with mass differences of about 0.030 amu at masses well above 200 amu.This information on the chemical composition makes it possible to determine structures of the ions originating from the surfaces, which increases insight into secondary ion formation processes. On the basis of the results from the plasma-treated PMMA surface, a tentative mechanism is given for the interaction of an oxygen plasma with PMMA in which formation of new polymer chain-ends containing acetyl groups plays an important role.Additional Material: 8 Ill.Type of Medium: Electronic ResourceURL: