Search Results - (Author, Cooperation:P. King)
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1Nickolas E. Zeibig-Kichas, Christopher W. Ardis, John-Pascal Berrill, and Joseph P. King
Hindawi
Published 2018Staff ViewPublication Date: 2018-03-06Publisher: HindawiPrint ISSN: 1687-9368Electronic ISSN: 1687-9376Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, NutritionPublished by: -
2Christy Anderson Brekken; Hikaru Hanawa Peterson; Robert P. King; David Conner
MDPI Publishing
Published 2018Staff ViewPublication Date: 2018-06-07Publisher: MDPI PublishingElectronic ISSN: 2071-1050Topics: Energy, Environment Protection, Nuclear Power EngineeringPublished by: -
3Staff View
Publication Date: 2018-01-23Publisher: Wiley-BlackwellPrint ISSN: 0270-9139Electronic ISSN: 1527-3350Topics: MedicinePublished by: -
4Aniruddha Sahasrabuddhe, Yang Hsia, Florian Busch, William Sheffler, Neil P. King, David Baker, Vicki H. Wysocki
National Academy of Sciences
Published 2018Staff ViewPublication Date: 2018-02-10Publisher: National Academy of SciencesPrint ISSN: 0027-8424Electronic ISSN: 1091-6490Topics: BiologyMedicineNatural Sciences in GeneralPublished by: -
5Lavender, S. L., Walsh, K. J. E., Caron, L.-P., King, M., Monkiewicz, S., Guishard, M., Zhang, Q., Hunt, B.
American Association for the Advancement of Science (AAAS)
Published 2018Staff ViewPublication Date: 2018-08-23Publisher: American Association for the Advancement of Science (AAAS)Electronic ISSN: 2375-2548Topics: Natural Sciences in GeneralPublished by: -
6N. P. King ; W. Sheffler ; M. R. Sawaya ; B. S. Vollmar ; J. P. Sumida ; I. Andre ; T. Gonen ; T. O. Yeates ; D. Baker
American Association for the Advancement of Science (AAAS)
Published 2012Staff ViewPublication Date: 2012-06-02Publisher: American Association for the Advancement of Science (AAAS)Print ISSN: 0036-8075Electronic ISSN: 1095-9203Topics: BiologyChemistry and PharmacologyComputer ScienceMedicineNatural Sciences in GeneralPhysicsKeywords: Chromatography, Gel ; Cloning, Molecular ; Computational Biology ; Computer Simulation ; Crystallography, X-Ray ; Escherichia coli/genetics/metabolism ; Hydrogen Bonding ; Microscopy, Electron ; Models, Molecular ; Molecular Weight ; Mutation ; *Nanostructures ; *Protein Engineering ; *Protein Multimerization ; Protein Structure, Secondary ; Protein Subunits/*chemistry/genetics ; Proteins/*chemistry/geneticsPublished by: -
7C. R. Webster ; P. R. Mahaffy ; G. J. Flesch ; P. B. Niles ; J. H. Jones ; L. A. Leshin ; S. K. Atreya ; J. C. Stern ; L. E. Christensen ; T. Owen ; H. Franz ; R. O. Pepin ; A. Steele ; C. Achilles ; C. Agard ; J. A. Alves Verdasca ; R. Anderson ; D. Archer ; C. Armiens-Aparicio ; R. Arvidson ; E. Atlaskin ; A. Aubrey ; B. Baker ; M. Baker ; T. Balic-Zunic ; D. Baratoux ; J. Baroukh ; B. Barraclough ; K. Bean ; L. Beegle ; A. Behar ; J. Bell ; S. Bender ; M. Benna ; J. Bentz ; G. Berger ; J. Berger ; D. Berman ; D. Bish ; D. F. Blake ; J. J. Blanco Avalos ; D. Blaney ; J. Blank ; H. Blau ; L. Bleacher ; E. Boehm ; O. Botta ; S. Bottcher ; T. Boucher ; H. Bower ; N. Boyd ; B. Boynton ; E. Breves ; J. Bridges ; N. Bridges ; W. Brinckerhoff ; D. Brinza ; T. Bristow ; C. Brunet ; A. Brunner ; W. Brunner ; A. Buch ; M. Bullock ; S. Burmeister ; M. Cabane ; F. Calef ; J. Cameron ; J. Campbell ; B. Cantor ; M. Caplinger ; J. Caride Rodriguez ; M. Carmosino ; I. Carrasco Blazquez ; A. Charpentier ; S. Chipera ; D. Choi ; B. Clark ; S. Clegg ; T. Cleghorn ; E. Cloutis ; G. Cody ; P. Coll ; P. Conrad ; D. Coscia ; A. Cousin ; D. Cremers ; J. Crisp ; A. Cros ; F. Cucinotta ; C. d'Uston ; S. Davis ; M. Day ; M. de la Torre Juarez ; L. DeFlores ; D. DeLapp ; J. DeMarines ; D. DesMarais ; W. Dietrich ; R. Dingler ; C. Donny ; B. Downs ; D. Drake ; G. Dromart ; A. Dupont ; B. Duston ; J. Dworkin ; M. D. Dyar ; L. Edgar ; K. Edgett ; C. Edwards ; L. Edwards ; B. Ehlmann ; B. Ehresmann ; J. Eigenbrode ; B. Elliott ; H. Elliott ; R. Ewing ; C. Fabre ; A. Fairen ; K. Farley ; J. Farmer ; C. Fassett ; L. Favot ; D. Fay ; F. Fedosov ; J. Feldman ; S. Feldman ; M. Fisk ; M. Fitzgibbon ; M. Floyd ; L. Fluckiger ; O. Forni ; A. Fraeman ; R. Francis ; P. Francois ; C. Freissinet ; K. L. French ; J. Frydenvang ; A. Gaboriaud ; M. Gailhanou ; J. Garvin ; O. Gasnault ; C. Geffroy ; R. Gellert ; M. Genzer ; D. Glavin ; A. Godber ; F. Goesmann ; W. Goetz ; D. Golovin ; F. Gomez Gomez ; J. Gomez-Elvira ; B. Gondet ; S. Gordon ; S. Gorevan ; J. Grant ; J. Griffes ; D. Grinspoon ; J. Grotzinger ; P. Guillemot ; J. Guo ; S. Gupta ; S. Guzewich ; R. Haberle ; D. Halleaux ; B. Hallet ; V. Hamilton ; C. Hardgrove ; D. Harker ; D. Harpold ; A. M. Harri ; K. Harshman ; D. Hassler ; H. Haukka ; A. Hayes ; K. Herkenhoff ; P. Herrera ; S. Hettrich ; E. Heydari ; V. Hipkin ; T. Hoehler ; J. Hollingsworth ; J. Hudgins ; W. Huntress ; J. Hurowitz ; S. Hviid ; K. Iagnemma ; S. Indyk ; G. Israel ; R. Jackson ; S. Jacob ; B. Jakosky ; E. Jensen ; J. K. Jensen ; J. Johnson ; M. Johnson ; S. Johnstone ; A. Jones ; J. Joseph ; I. Jun ; L. Kah ; H. Kahanpaa ; M. Kahre ; N. Karpushkina ; W. Kasprzak ; J. Kauhanen ; L. Keely ; O. Kemppinen ; D. Keymeulen ; M. H. Kim ; K. Kinch ; P. King ; L. Kirkland ; G. Kocurek ; A. Koefoed ; J. Kohler ; O. Kortmann ; A. Kozyrev ; J. Krezoski ; D. Krysak ; R. Kuzmin ; J. L. Lacour ; V. Lafaille ; Y. Langevin ; N. Lanza ; J. Lasue ; S. Le Mouelic ; E. M. Lee ; Q. M. Lee ; D. Lees ; M. Lefavor ; M. Lemmon ; A. Lepinette Malvitte ; R. Leveille ; E. Lewin-Carpintier ; K. Lewis ; S. Li ; L. Lipkaman ; C. Little ; M. Litvak ; E. Lorigny ; G. Lugmair ; A. Lundberg ; E. Lyness ; M. Madsen ; J. Maki ; A. Malakhov ; C. Malespin ; M. Malin ; N. Mangold ; G. Manhes ; H. Manning ; G. Marchand ; M. Marin Jimenez ; C. Martin Garcia ; D. Martin ; M. Martin ; J. Martinez-Frias ; J. Martin-Soler ; F. J. Martin-Torres ; P. Mauchien ; S. Maurice ; A. McAdam ; E. McCartney ; T. McConnochie ; E. McCullough ; I. McEwan ; C. McKay ; S. McLennan ; S. McNair ; N. Melikechi ; P. Y. Meslin ; M. Meyer ; A. Mezzacappa ; H. Miller ; K. Miller ; R. Milliken ; D. Ming ; M. Minitti ; M. Mischna ; I. Mitrofanov ; J. Moersch ; M. Mokrousov ; A. Molina Jurado ; J. Moores ; L. Mora-Sotomayor ; J. M. Morookian ; R. Morris ; S. Morrison ; R. Mueller-Mellin ; J. P. Muller ; G. Munoz Caro ; M. Nachon ; S. Navarro Lopez ; R. Navarro-Gonzalez ; K. Nealson ; A. Nefian ; T. Nelson ; M. Newcombe ; C. Newman ; H. Newsom ; S. Nikiforov ; B. Nixon ; E. Noe Dobrea ; T. Nolan ; D. Oehler ; A. Ollila ; T. Olson ; M. A. de Pablo Hernandez ; A. Paillet ; E. Pallier ; M. Palucis ; T. Parker ; Y. Parot ; K. Patel ; M. Paton ; G. Paulsen ; A. Pavlov ; B. Pavri ; V. Peinado-Gonzalez ; L. Peret ; R. Perez ; G. Perrett ; J. Peterson ; C. Pilorget ; P. Pinet ; J. Pla-Garcia ; I. Plante ; F. Poitrasson ; J. Polkko ; R. Popa ; L. Posiolova ; A. Posner ; I. Pradler ; B. Prats ; V. Prokhorov ; S. W. Purdy ; E. Raaen ; L. Radziemski ; S. Rafkin ; M. Ramos ; E. Rampe ; F. Raulin ; M. Ravine ; G. Reitz ; N. Renno ; M. Rice ; M. Richardson ; F. Robert ; K. Robertson ; J. A. Rodriguez Manfredi ; J. J. Romeral-Planello ; S. Rowland ; D. Rubin ; M. Saccoccio ; A. Salamon ; J. Sandoval ; A. Sanin ; S. A. Sans Fuentes ; L. Saper ; P. Sarrazin ; V. Sautter ; H. Savijarvi ; J. Schieber ; M. Schmidt ; W. Schmidt ; D. Scholes ; M. Schoppers ; S. Schroder ; S. Schwenzer ; E. Sebastian Martinez ; A. Sengstacken ; R. Shterts ; K. Siebach ; T. Siili ; J. Simmonds ; J. B. Sirven ; S. Slavney ; R. Sletten ; M. Smith ; P. Sobron Sanchez ; N. Spanovich ; J. Spray ; S. Squyres ; K. Stack ; F. Stalport ; T. Stein ; N. Stewart ; S. L. Stipp ; K. Stoiber ; E. Stolper ; B. Sucharski ; R. Sullivan ; R. Summons ; D. Sumner ; V. Sun ; K. Supulver ; B. Sutter ; C. Szopa ; F. Tan ; C. Tate ; S. Teinturier ; I. ten Kate ; P. Thomas ; L. Thompson ; R. Tokar ; M. Toplis ; J. Torres Redondo ; M. Trainer ; A. Treiman ; V. Tretyakov ; R. Urqui-O'Callaghan ; J. Van Beek ; T. Van Beek ; S. VanBommel ; D. Vaniman ; A. Varenikov ; A. Vasavada ; P. Vasconcelos ; E. Vicenzi ; A. Vostrukhin ; M. Voytek ; M. Wadhwa ; J. Ward ; E. Weigle ; D. Wellington ; F. Westall ; R. C. Wiens ; M. B. Wilhelm ; A. Williams ; J. Williams ; R. Williams ; R. B. Williams ; M. Wilson ; R. Wimmer-Schweingruber ; M. Wolff ; M. Wong ; J. Wray ; M. Wu ; C. Yana ; A. Yen ; A. Yingst ; C. Zeitlin ; R. Zimdar ; M. P. Zorzano Mier
American Association for the Advancement of Science (AAAS)
Published 2013Staff ViewPublication Date: 2013-07-23Publisher: American Association for the Advancement of Science (AAAS)Print ISSN: 0036-8075Electronic ISSN: 1095-9203Topics: BiologyChemistry and PharmacologyComputer ScienceMedicineNatural Sciences in GeneralPhysicsPublished by: -
8N. P. King ; J. B. Bale ; W. Sheffler ; D. E. McNamara ; S. Gonen ; T. Gonen ; T. O. Yeates ; D. Baker
Nature Publishing Group (NPG)
Published 2014Staff ViewPublication Date: 2014-05-30Publisher: Nature Publishing Group (NPG)Print ISSN: 0028-0836Electronic ISSN: 1476-4687Topics: BiologyChemistry and PharmacologyMedicineNatural Sciences in GeneralPhysicsKeywords: Computer Simulation ; Crystallography, X-Ray ; Drug Design ; Models, Molecular ; Nanostructures/*chemistry/ultrastructure ; Protein Subunits/chemistry ; Proteins/*chemistry/ultrastructurePublished by: -
9Chada, N., Chattrakun, K., Marsh, B. P., Mao, C., Bariya, P., King, G. M.
American Association for the Advancement of Science (AAAS)
Published 2018Staff ViewPublication Date: 2018-10-25Publisher: American Association for the Advancement of Science (AAAS)Electronic ISSN: 2375-2548Topics: Natural Sciences in GeneralPublished by: -
10Chen, J. G., Crooks, R. M., Seefeldt, L. C., Bren, K. L., Bullock, R. M., Darensbourg, M. Y., Holland, P. L., Hoffman, B., Janik, M. J., Jones, A. K., Kanatzidis, M. G., King, P., Lancaster, K. M., Lymar, S. V., Pfromm, P., Schneider, W. F., Schrock, R. R.
American Association for the Advancement of Science (AAAS)
Published 2018Staff ViewPublication Date: 2018-05-25Publisher: American Association for the Advancement of Science (AAAS)Print ISSN: 0036-8075Electronic ISSN: 1095-9203Topics: BiologyChemistry and PharmacologyGeosciencesComputer ScienceMedicineNatural Sciences in GeneralPhysicsKeywords: Chemistry, Online OnlyPublished by: -
11J. S. Levy, C. I. Fassett, L. X. Rader, I. R. King, P. M. Chaffey, C. M. Wagoner, A. E. Hanlon, J. L. Watters, M. A. Kreslavsky, J. W. Holt, A. T. Russell, M. D. Dyar
Wiley-Blackwell
Published 2018Staff ViewPublication Date: 2018-01-10Publisher: Wiley-BlackwellPrint ISSN: 0148-0227Topics: GeosciencesPhysicsPublished by: -
12Staff View
Publication Date: 2018-03-07Publisher: Institute of Physics (IOP)Print ISSN: 1748-9318Electronic ISSN: 1748-9326Topics: BiologyEnergy, Environment Protection, Nuclear Power EngineeringPublished by: -
13Breese, M. B. H. ; King, P. J. C. ; Whitehurst, J. ; Booker, G. R. ; Grime, G. W. ; Watt, F. ; Romano, L. T. ; Parker, E. H. C.
[S.l.] : American Institute of Physics (AIP)
Published 1993Staff ViewISSN: 1089-7550Source: AIP Digital ArchiveTopics: PhysicsNotes: Interface dislocations present in a Si0.85Ge0.15/Si sample have been imaged using the channeling scanning transmission ion microscopy (CSTIM) method with a 2 MeV proton beam 200 nm across. Groups of parallel dislocations gave dark bands of contrast down to ∼1.5 μm across, the contrast arising from dechanneling of the beam by the bent lattice planes. Tilting of the sample caused the band contrast to change and gave quantitative data concerning the local bending of the lattice planes. A low-angle boundary model was developed to describe the effect of the groups of dislocations on the channeling contrast. Channeling and topography contrast were obtained from mesa structures present on the sample. Improvements in the sensitivity of the CSTIM method are discussed. The dislocations in the sample were initially characterized by transmission electron microscopy.Type of Medium: Electronic ResourceURL: -
14Breese, M. B. H. ; King, P. J. C. ; Grime, G. W. ; Watt, F.
[S.l.] : American Institute of Physics (AIP)
Published 1992Staff ViewISSN: 1089-7550Source: AIP Digital ArchiveTopics: PhysicsNotes: Ionizing radiation such as photons, keV electrons, or MeV ions can generate electron-hole pairs in semiconducting material. The high penetrating power of MeV light ions allows them to generate electron-hole pairs from deep within intact microelectronic devices, so images can be formed of the device active areas with very little degradation of the spatial resolution of the focused MeV ion beam. Furthermore, the ion-beam-induced charge (IBIC) image contrast is not strongly affected by the energy loss through the overlying device layers. This article is the first to demonstrate the capability of a nuclear microprobe to generate IBIC images of the active regions of devices through the passivation and metallization layers. The effect of the carrier generation volume on IBIC resolution is assessed. The ability of IBIC to align the major crystal axes of semiconductor samples is shown, and the effect of ion-induced damage on IBIC image contrast is considered.Type of Medium: Electronic ResourceURL: -
15Staff View
ISSN: 1089-7682Source: AIP Digital ArchiveTopics: PhysicsNotes: In this study we examine the complex and chaotic oscillations of a dynamical system with nonlinear excitation and restoring forces for the purpose of controlling these oscillatory states. The physical system, modeled as a system of first-order nonlinear ordinary differential equations, takes into account a geometric nonlinearity in the restoring force, a quadratic viscous drag, and a harmonic excitation force. It is controlled using small perturbations about a selected unstable cycle and control is instigated for periodic cycles of varying periodicities. The controller, when applied on the dynamical system with additive random noise in the excitation, successfully controls the system with noise levels in excess of 5% of the total energy, giving the first evidence that (stochastic) control of these systems is possible. © 1997 American Institute of Physics.Type of Medium: Electronic ResourceURL: -
16KING, P. A. ; LOPES, A. ; TANG, M. H. Y. ; LAM, S. K. ; MA, H. K.
Oxford, UK : Blackwell Publishing Ltd
Published 1991Staff ViewISSN: 1471-0528Source: Blackwell Publishing Journal Backfiles 1879-2005Topics: MedicineType of Medium: Electronic ResourceURL: -
17King, P. J. C. ; Breese, M. B. H. ; Meekeson, D. ; Smulders, P. J. M. ; Wilshaw, P. R. ; Grime, G. W.
[S.l.] : American Institute of Physics (AIP)
Published 1996Staff ViewISSN: 1089-7550Source: AIP Digital ArchiveTopics: PhysicsNotes: This paper shows ion channeling images of the strain field produced by precipitate particles in a crystal matrix. Images have been produced by mapping the energy of 3 MeV protons transmitted through a thinned silicon crystal containing colonies of copper silicide particles, with the incident beam at or close to planar channeling directions of the lattice. Features of the precipitate contrast observed as a function of beam tilt angle away from channeling alignment are qualitatively explained using a model based on symmetrical plane rotation of the crystal lattice around the colonies. © 1996 American Institute of Physics.Type of Medium: Electronic ResourceURL: -
18Staff View
ISSN: 1089-7550Source: AIP Digital ArchiveTopics: PhysicsNotes: Previous studies have shown that the electric arc furnace is chaotic in nature and hence standard control techniques are not effective. However, human (heuristic) control is used every day on electric arc furnaces. A furnace operator assesses the performance of the furnace and makes judgments based on past experience and intuition. In order to improve the effectiveness of this control, a qualitative understanding of the operating conditions of the furnace is required. Artificial neural networks are capable of learning the system dynamics of the electric arc furnace. This article describes a feedforward neural network trained to model arc furnace electrical wave forms taken from an experimental arc furnace. The output of this model is then used in estimating the future state of the furnace for control purposes.Type of Medium: Electronic ResourceURL: -
19Pianetta, P. ; Lindau, I. ; King, P. L. ; Keenlyside, M. ; Knapp, G. ; Browning, R.
[S.l.] : American Institute of Physics (AIP)
Published 1989Staff ViewISSN: 1089-7623Source: AIP Digital ArchiveTopics: PhysicsElectrical Engineering, Measurement and Control TechnologyNotes: The capabilities of a direct imaging photoelectron microscope (MicroESCA from Surface Science Instruments) have been demonstrated in a set of experiments carried out at the Stanford Synchrotron Radiation Laboratory (SSRL) using a torroidal grating monochromator in the photon energy range 20–170 eV. Photoelectrons from a 300×300 μm2 sample area are projected in the diverging magnetic field of a superconducting solenoid and an image reflecting the variation in photoelectron yield is recorded digitally with a resistive anode imaging detector. Lateral resolution is better than 5 μm. A retarding field analyzer located in front of the imaging detector acts as a high-pass filter and allows us to obtain a series of spectrally resolved images which can be processed to give a spot XPS analysis of areas as small as 5×5 μm2. Images from a sample of patterned aluminum on silicon are presented to demonstrate the potential of the instrument.Type of Medium: Electronic ResourceURL: -
20KING, P. A. ; LI, D. F. H. ; NGAN, H. Y. S. ; MA, H. K.
Oxford, UK : Blackwell Publishing Ltd
Published 1989Staff ViewISSN: 1471-0528Source: Blackwell Publishing Journal Backfiles 1879-2005Topics: MedicineType of Medium: Electronic ResourceURL: