Search Results - (Author, Cooperation:N. Galante)

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  1. 1
    E. Aliu ; T. Arlen ; T. Aune ; M. Beilicke ; W. Benbow ; A. Bouvier ; S. M. Bradbury ; J. H. Buckley ; V. Bugaev ; K. Byrum ; A. Cannon ; A. Cesarini ; J. L. Christiansen ; L. Ciupik ; E. Collins-Hughes ; M. P. Connolly ; W. Cui ; R. Dickherber ; C. Duke ; M. Errando ; A. Falcone ; J. P. Finley ; G. Finnegan ; L. Fortson ; A. Furniss ; N. Galante ; D. Gall ; K. Gibbs ; G. H. Gillanders ; S. Godambe ; S. Griffin ; J. Grube ; R. Guenette ; G. Gyuk ; D. Hanna ; J. Holder ; H. Huan ; G. Hughes ; C. M. Hui ; T. B. Humensky ; A. Imran ; P. Kaaret ; N. Karlsson ; M. Kertzman ; D. Kieda ; H. Krawczynski ; F. Krennrich ; M. J. Lang ; M. Lyutikov ; A. S. Madhavan ; G. Maier ; P. Majumdar ; S. McArthur ; A. McCann ; M. McCutcheon ; P. Moriarty ; R. Mukherjee ; P. Nunez ; R. A. Ong ; M. Orr ; A. N. Otte ; N. Park ; J. S. Perkins ; F. Pizlo ; M. Pohl ; H. Prokoph ; J. Quinn ; K. Ragan ; L. C. Reyes ; P. T. Reynolds ; E. Roache ; H. J. Rose ; J. Ruppel ; D. B. Saxon ; M. Schroedter ; G. H. Sembroski ; G. D. Senturk ; A. W. Smith ; D. Staszak ; G. Tesic ; M. Theiling ; S. Thibadeau ; K. Tsurusaki ; J. Tyler ; A. Varlotta ; V. V. Vassiliev ; S. Vincent ; M. Vivier ; S. P. Wakely ; J. E. Ward ; T. C. Weekes ; A. Weinstein ; T. Weisgarber ; D. A. Williams ; B. Zitzer
    American Association for the Advancement of Science (AAAS)
    Published 2011
    Staff View
    Publication Date:
    2011-10-08
    Publisher:
    American Association for the Advancement of Science (AAAS)
    Print ISSN:
    0036-8075
    Electronic ISSN:
    1095-9203
    Topics:
    Biology
    Chemistry and Pharmacology
    Computer Science
    Medicine
    Natural Sciences in General
    Physics
    Published by:
    Latest Papers from Table of Contents or Articles in Press
  2. 2
    Galante, N. ; Tagliaferro, A.
    Springer
    Published 1991
    Staff View
    ISSN:
    0392-6737
    Keywords:
    Noise processes and phenomena
    Source:
    Springer Online Journal Archives 1860-2000
    Topics:
    Physics
    Notes:
    Summary Measurements of photoinduced current noise in amorphous silicon solar cells are reported. A 1/f n (n≈1) component, superimposed to a frequency-independent one due to simple shot noise, is attributed to the presence of defects limiting the conversion efficiency of the cell. In particular, large defects, such as local shorts or pin holes, can easily be detected since they are characterized by a very large increase of the 1/f n component. In general, even in the absence of such large defects, a correlation between the intensity of the 1/f n component and the cell conversion efficiency is found.
    Type of Medium:
    Electronic Resource
    URL:
    Articles: DFG German National Licenses