Search Results - (Author, Cooperation:M. Salmeron)

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  1. 1
    J. S. Choi ; J. S. Kim ; I. S. Byun ; D. H. Lee ; M. J. Lee ; B. H. Park ; C. Lee ; D. Yoon ; H. Cheong ; K. H. Lee ; Y. W. Son ; J. Y. Park ; M. Salmeron
    American Association for the Advancement of Science (AAAS)
    Published 2011
    Staff View
    Publication Date:
    2011-07-02
    Publisher:
    American Association for the Advancement of Science (AAAS)
    Print ISSN:
    0036-8075
    Electronic ISSN:
    1095-9203
    Topics:
    Biology
    Chemistry and Pharmacology
    Computer Science
    Medicine
    Natural Sciences in General
    Physics
    Published by:
    http://www.aaas.org/

    Latest Papers from Table of Contents or Articles in Press
  2. 2
    M. Salmeron
    American Association for the Advancement of Science (AAAS)
    Published 2014
    Staff View
    Publication Date:
    2014-03-08
    Publisher:
    American Association for the Advancement of Science (AAAS)
    Print ISSN:
    0036-8075
    Electronic ISSN:
    1095-9203
    Topics:
    Biology
    Chemistry and Pharmacology
    Computer Science
    Medicine
    Natural Sciences in General
    Physics
    Published by:
    http://www.aaas.org/

    Latest Papers from Table of Contents or Articles in Press
  3. 3
    D. Zherebetskyy ; M. Scheele ; Y. Zhang ; N. Bronstein ; C. Thompson ; D. Britt ; M. Salmeron ; P. Alivisatos ; L. W. Wang
    American Association for the Advancement of Science (AAAS)
    Published 2014
    Staff View
    Publication Date:
    2014-05-31
    Publisher:
    American Association for the Advancement of Science (AAAS)
    Print ISSN:
    0036-8075
    Electronic ISSN:
    1095-9203
    Topics:
    Biology
    Chemistry and Pharmacology
    Computer Science
    Medicine
    Natural Sciences in General
    Physics
    Published by:
    http://www.aaas.org/

    Latest Papers from Table of Contents or Articles in Press
  4. 4
    J. J. Velasco-Velez ; C. H. Wu ; T. A. Pascal ; L. F. Wan ; J. Guo ; D. Prendergast ; M. Salmeron
    American Association for the Advancement of Science (AAAS)
    Published 2014
    Staff View
    Publication Date:
    2014-10-25
    Publisher:
    American Association for the Advancement of Science (AAAS)
    Print ISSN:
    0036-8075
    Electronic ISSN:
    1095-9203
    Topics:
    Biology
    Chemistry and Pharmacology
    Computer Science
    Medicine
    Natural Sciences in General
    Physics
    Published by:
    http://www.aaas.org/

    Latest Papers from Table of Contents or Articles in Press
  5. 5
    B. Eren ; D. Zherebetskyy ; L. L. Patera ; C. H. Wu ; H. Bluhm ; C. Africh ; L. W. Wang ; G. A. Somorjai ; M. Salmeron
    American Association for the Advancement of Science (AAAS)
    Published 2016
    Staff View
    Publication Date:
    2016-01-30
    Publisher:
    American Association for the Advancement of Science (AAAS)
    Print ISSN:
    0036-8075
    Electronic ISSN:
    1095-9203
    Topics:
    Biology
    Chemistry and Pharmacology
    Computer Science
    Medicine
    Natural Sciences in General
    Physics
    Published by:
    http://www.aaas.org/

    Latest Papers from Table of Contents or Articles in Press
  6. 6
    F. F. Tao ; M. Salmeron
    American Association for the Advancement of Science (AAAS)
    Published 2011
    Staff View
    Publication Date:
    2011-01-15
    Publisher:
    American Association for the Advancement of Science (AAAS)
    Print ISSN:
    0036-8075
    Electronic ISSN:
    1095-9203
    Topics:
    Biology
    Chemistry and Pharmacology
    Computer Science
    Medicine
    Natural Sciences in General
    Physics
    Published by:
    http://www.aaas.org/

    Latest Papers from Table of Contents or Articles in Press
  7. 7
    Botkin, D. ; Weiss, S. ; Ogletree, D. F. ; Beeman, J. ; Salmeron, M. ; Chemla, D. S.

    [S.l.] : American Institute of Physics (AIP)
    Published 1995
    Staff View
    ISSN:
    1089-7623
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Electrical Engineering, Measurement and Control Technology
    Notes:
    We describe an ultrafast scanning tunneling microscope (USTM) with picosecond temporal resolution. We present results of single-point ultrafast tunneling measurements and outline some of the methods and pitfalls in USTM. Ultimately, the technique has the potential to create picosecond scale movies of surface phenomena with atomic spatial resolution. © 1995 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.1145359

    Articles: DFG German National Licenses
  8. 8
    Ogletree, D. F. ; Carpick, R. W. ; Salmeron, M.

    [S.l.] : American Institute of Physics (AIP)
    Published 1996
    Staff View
    ISSN:
    1089-7623
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Electrical Engineering, Measurement and Control Technology
    Notes:
    The atomic force microscope can provide information on the atomic-level frictional properties of surfaces, but reproducible quantitative measurements are difficult to obtain. Parameters that are either unknown or difficult to precisely measure include the normal and lateral cantilever force constants (particularly with microfabricated cantilevers), the tip height, the deflection sensor response, and the tip structure and composition at the tip-surface contact. We present an in situ experimental procedure to determine the response of a cantilever to lateral forces in terms of its normal force response. This procedure is quite general. It will work with any type of deflection sensor and does not require the knowledge or direct measurement of the lever dimensions or the tip height. In addition, the shape of the tip apex can be determined. We also discuss a number of specific issues related to force and friction measurements using optical lever deflection sensing. We present experimental results on the lateral force response of commercially available V-shaped cantilevers. Our results are consistent with estimates of lever mechanical properties using continuum elasticity theory. © 1996 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.1147411

    Articles: DFG German National Licenses
  9. 9
    Dai, Q. ; Vollmer, R. ; Carpick, R. W. ; Ogletree, D. F. ; Salmeron, M.

    [S.l.] : American Institute of Physics (AIP)
    Published 1995
    Staff View
    ISSN:
    1089-7623
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Electrical Engineering, Measurement and Control Technology
    Notes:
    A new atomic force microscope (AFM) that operates in ultrahigh vacuum (UHV) is described. The sample is held fixed with spring clamps while the AMF cantilever and deflection sensor are scanned above it. Thus, the sample is easily coupled to a liquid nitrogen cooled thermal reservoir which allows AFM operation from ≈100 K to room temperature. AFM operation above room temperature is also possible. The microscope head is capable of coarse x-y positioning over millimeter distances so that AFM images can be taken virtually anywhere upon a macroscopic sample. The optical beam deflection scheme is used for detection, allowing simultaneous normal and lateral force measurements. The sample can be transferred from the AFM stage to a low energy electron diffraction/Auger electron spectrometer stage for surface analysis. Atomic lattice resolution AFM images taken in UHV are presented at 110, 296, and 430 K. © 1995 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.1146097

    Articles: DFG German National Licenses
  10. 10
    Bluhm, H. ; Pan, S. H. ; Xu, L. ; Inoue, T. ; Ogletree, D. F. ; Salmeron, M.

    [S.l.] : American Institute of Physics (AIP)
    Published 1998
    Staff View
    ISSN:
    1089-7623
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Electrical Engineering, Measurement and Control Technology
    Notes:
    We present the design of a scanning force microscope and vacuum chamber for the growth and imaging of ice films in thermodynamic equilibrium and under controlled super or undersaturation. The apparatus allows measurements in the temperature range from −60 to +80 °C in a controlled water vapor atmosphere. First results on the morphology and the frictional properties of thin ice films on mica cleavage faces are presented. The films are found to grow in a two-dimensional manner, often exhibiting dendritic growth shapes. The lateral force measured on ice is higher than that observed on the surrounding substrate. © 1998 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.1148841

    Articles: DFG German National Licenses
  11. 11
    Frantz, P. ; Wolf, F. ; Xiao, X.-d. ; Chen, Y. ; Bosch, S. ; Salmeron, M.

    [S.l.] : American Institute of Physics (AIP)
    Published 1997
    Staff View
    ISSN:
    1089-7623
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Electrical Engineering, Measurement and Control Technology
    Notes:
    We describe the design, calibration, and performance of surface forces apparatus with the capability of illumination of the contact interface for spectroscopic investigation using optical techniques. The apparatus can be placed in the path of a Nd-YAG laser for studies of the linear response or the second harmonic and sum-frequency generation from a material confined between the two surfaces. In addition to the standard fringes of equal chromatic order technique, which we have digitized for accurate and fast analysis, the distance of separation can be measured with a fiber-optic interferometer during spectroscopic measurements (2 Å resolution and 10 ms response time). The sample approach is accomplished through application of a motor drive, piezoelectric actuator, or electromagnetic lever deflection for variable degrees of range, sensitivity, and response time. To demonstrate the operation of the instrument, the stepwise expulsion of discrete layers of octamethylcyclotetrasiloxane from the contact is shown. Lateral forces may also be studied by using piezoelectric bimorphs to induce and direct the motion of one surface. © 1997 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.1148148

    Articles: DFG German National Licenses
  12. 12
    McIntyre, B. J. ; Salmeron, M. ; Somorjai, G. A.

    [S.l.] : American Institute of Physics (AIP)
    Published 1993
    Staff View
    ISSN:
    1089-7623
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Electrical Engineering, Measurement and Control Technology
    Notes:
    We describe the design and construction of a scanning tunneling microscope (STM), which is contained in a reactor cell and allows in situ operation throughout a wide range of pressures and temperatures. This STM is capable of imaging in pressures ranging from ultrahigh vacuum up to several atmospheres. Samples can also be easily moved in and out of the STM cell in a small separate vacuum transfer chamber for external characterization and treatment. The equilibration time and stability of the microscope after temperature changes was determined at atmospheric pressures, by monitoring the evolution of atomically resolved images of highly oriented pyrolytic graphite at temperatures ranging from 300 to 425 K. We have also examined the stability when flowing gases are used instead of stationary pressures. In preliminary experiments using Pt(111) and (110) crystals, we have observed the effect of atmospheres of H2 and O2 on the structure of these surfaces.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.1144198

    Articles: DFG German National Licenses
  13. 13
    Carpick, R. W. ; Ogletree, D. F. ; Salmeron, M.

    Woodbury, NY : American Institute of Physics (AIP)
    Published 1997
    Staff View
    ISSN:
    1077-3118
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    We present a technique to measure the lateral stiffness of the nanometer-sized contact formed between a friction force microscope tip and a sample surface. Since the lateral stiffness of an elastic contact is proportional to the contact radius, this measurement can be used to study the relationship between friction, load, and contact area. As an example, we measure the lateral stiffness of the contact between a silicon nitride tip and muscovite mica in a humid atmosphere (55% relative humidity) as a function of load. Comparison with friction measurements confirms that friction is proportional to contact area and allows determination of the shear strength. © 1997 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.118639

    Articles: DFG German National Licenses
  14. 14
    van den Oetelaar, R. J. A. ; Xu, L. ; Ogletree, D. F. ; Salmeron, M.

    [S.l.] : American Institute of Physics (AIP)
    Published 2001
    Staff View
    ISSN:
    1089-7550
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    Scanning polarization force microscopy was used to study changes in surface potential (tribocharging) caused by the contact between a tungsten carbide tip and the amorphous carbon coating of a hard disk, both when bare and when covered with Zdol-TX lubricant. The surface potential change produced by tip contact decays with time at a rate that is strongly dependent on lubricant coverage and on the presence of oxygen and water vapor in the environment. Two different charging mechanisms are proposed. One involves chemical modification of the surface by removal of oxygen bound to the surface. This gives rise to a potential change that decays with time. Another mechanism involves trapping of charge in states within the energy gap of the insulating carbon film. The potential change due to this trapped charge does not decay over periods much greater than 1 h. © 2001 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.1351001

    Articles: DFG German National Licenses
  15. 15
    Ortiz, C. ; Vurens, G. ; Chen, M. M. ; Salmeron, M.

    [S.l.] : American Institute of Physics (AIP)
    Published 1988
    Staff View
    ISSN:
    1089-7550
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    This work studies the influence of oxygen flow and substrate temperature on the physical properties of reactive sputtered thin films of iron oxide spinels. We have focused on the variations of the magnetic moment, which can be as low as 20% of the bulk value, for certain experimental conditions. We present a model which attributes the missing moment to a mispopulation of Fe moments on the A and B sites. Direct experimental evidence to prove this model is obtained from conversion electron Mössbauer spectroscopic experiments, which correlate the missing moment with increased A-site population compared with the "textbook'' population (only 8 A sites out of 64 are filled). For example, samples deposited at room temperature have always a low moment and are found to have a large A-site population. When the samples are annealed in vacuum under specific conditions to maintain the oxygen ratio and to give kinetic energy to the atoms to reach their spinel positions, an increase of the magnetic moment is observed.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.340619

    Articles: DFG German National Licenses
  16. 16
    Weiss, S. ; Ogletree, D. F. ; Botkin, D. ; Salmeron, M. ; Chemla, D. S.

    Woodbury, NY : American Institute of Physics (AIP)
    Published 1993
    Staff View
    ISSN:
    1077-3118
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    We have measured the response of the tunneling gap of a scanning tunneling microscope to excitation by a subpicosecond electrical pulse. Combining ultrashort laser pulses techniques with scanning tunneling microscopy (STM), we have obtained simultaneous 2-ps time resolution and 50-A(ring) spatial resolution. This is a 9 orders of magnitude improvement in the time resolution currently attainable with STM. The potential of this powerful technique for studying ultrafast dynamical phenomena on surfaces with atomic resolution and mesoscopic electronic device physics is discussed.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.110435

    Articles: DFG German National Licenses
  17. 17
    Zheng, Z. F. ; Salmeron, M. B. ; Weber, E. R.

    Woodbury, NY : American Institute of Physics (AIP)
    Published 1994
    Staff View
    ISSN:
    1077-3118
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.113089

    Articles: DFG German National Licenses
  18. 18
    Zheng, Z. F. ; Salmeron, M. B. ; Weber, E. R.

    Woodbury, NY : American Institute of Physics (AIP)
    Published 1994
    Staff View
    ISSN:
    1077-3118
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    ZnGa acceptor atoms in the first to sixth layer below the GaAs (110) cleavage plane have been identified. For the first time, we find that the empty state scanning tunneling microscopy image of a ZnGa acceptor is a characteristic equal latitude triangle-shaped feature of ∼4 nm width with a (110) mirror plane. The filled state image, however, is a spherical feature of similar size. These unique features can be used as the signature for the identification of ZnGa in GaAs.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.111771

    Articles: DFG German National Licenses
  19. 19
    Botkin, D. ; Glass, J. ; Chemla, D. S. ; Ogletree, D. F. ; Salmeron, M. ; Weiss, S.

    Woodbury, NY : American Institute of Physics (AIP)
    Published 1996
    Staff View
    ISSN:
    1077-3118
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    Time resolved tunnel current was measured over 4 orders of magnitude in separation between tip and sample using an ultrafast scanning tunneling microscope (USTM). These measurements reveal two distinct regimes for tip height dependence of the signal. In addition, we report 900 femtosecond temporal resolution with a sensitivity of 20 mV/(square root of)Hz in USTM measurements of voltage pulses on a coplanar transmission line, and we show that the microscope operates as a high impedance probe. © 1996 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.117581

    Articles: DFG German National Licenses
  20. 20
    Staff View
    ISSN:
    1365-4632
    Source:
    Blackwell Publishing Journal Backfiles 1879-2005
    Topics:
    Medicine
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1111/j.1365-4362.1992.tb02731.x

    Articles: DFG German National Licenses