Search Results - (Author, Cooperation:K. Rhie)
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1S. Joo ; T. Kim ; S. H. Shin ; J. Y. Lim ; J. Hong ; J. D. Song ; J. Chang ; H. W. Lee ; K. Rhie ; S. H. Han ; K. H. Shin ; M. Johnson
Nature Publishing Group (NPG)
Published 2013Staff ViewPublication Date: 2013-02-01Publisher: Nature Publishing Group (NPG)Print ISSN: 0028-0836Electronic ISSN: 1476-4687Topics: BiologyChemistry and PharmacologyMedicineNatural Sciences in GeneralPhysicsPublished by: -
2Staff View
ISSN: 1089-7550Source: AIP Digital ArchiveTopics: PhysicsNotes: Studies of effective permeability, core loss and saturation magnetostriction of Fe83−xZr7B10Mx (M=Ni, Nb) alloys revealed that the domain width is smallest around x=0.10. We measured the resistivity and low field Hall coefficients of these alloys and found that the maxima of resistivity and Hall coefficients occurred roughly at the same concentrations. Larger surface area of smaller domains is considered the reason. © 1997 American Institute of Physics.Type of Medium: Electronic ResourceURL: -
3Staff View
ISSN: 0375-9601Source: Elsevier Journal Backfiles on ScienceDirect 1907 - 2002Topics: PhysicsType of Medium: Electronic ResourceURL: -
4Staff View
ISSN: 1434-6036Source: Springer Online Journal Archives 1860-2000Topics: PhysicsNotes: Abstract Values of the room temperature Hall coefficients and electrical resistivity of amorphous melt spun (Zr0.64Ni0.36)1−x Al x and (Zr0.64Ni0.36)1−x Ga x alloys forx=0–0.25 are reported. Addition of Al or Ga to Zr0.64Ni0.36 dramatically increases the already positive Hall coefficient of this alloy and also increases the electrical resistivity and crystallization temperature.Type of Medium: Electronic ResourceURL: -
5Rhie, K. ; Rong, Pan ; Naugle, D. G. ; Harbert, S. J. ; Wolfenden, A. ; Clearfield, A. ; Callaway, T. O.
Springer
Published 1988Staff ViewISSN: 1573-4811Source: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsType of Medium: Electronic ResourceURL: