Search Results - (Author, Cooperation:J. D. Denlinger)
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1Latest Papers from Table of Contents or Articles in PressRobert Kealhofer, Sooyoung Jang, Sinéad M. Griffin, Caolan John, Katherine A. Benavides, Spencer Doyle, T. Helm, Philip J. W. Moll, Jeffrey B. Neaton, Julia Y. Chan, J. D. Denlinger, and James G. Analytis
American Physical Society (APS)
Published 2018Staff ViewPublication Date: 2018-01-11Publisher: American Physical Society (APS)Print ISSN: 1098-0121Electronic ISSN: 1095-3795Topics: PhysicsKeywords: Electronic structure and strongly correlated systemsPublished by: -
2Latest Papers from Table of Contents or Articles in PressE. Razzoli, B. Zwartsenberg, M. Michiardi, F. Boschini, R. P. Day, I. S. Elfimov, J. D. Denlinger, V. Süss, C. Felser, and A. Damascelli
American Physical Society (APS)
Published 2018Staff ViewPublication Date: 2018-05-05Publisher: American Physical Society (APS)Print ISSN: 1098-0121Electronic ISSN: 1095-3795Topics: PhysicsKeywords: Electronic structure and strongly correlated systemsPublished by: -
3Latest Papers from Table of Contents or Articles in PressSoohyun Cho, Jin-Hong Park, Jisook Hong, Jongkeun Jung, Beom Seo Kim, Garam Han, Wonshik Kyung, Yeongkwan Kim, S.-K. Mo, J. D. Denlinger, Ji Hoon Shim, Jung Hoon Han, Changyoung Kim, and Seung Ryong Park
American Physical Society (APS)
Published 2018Staff ViewPublication Date: 2018-10-30Publisher: American Physical Society (APS)Print ISSN: 0031-9007Electronic ISSN: 1079-7114Topics: PhysicsKeywords: Condensed Matter: Electronic Properties, etc.Published by: -
4Latest Papers from Table of Contents or Articles in PressY. K. Kim ; O. Krupin ; J. D. Denlinger ; A. Bostwick ; E. Rotenberg ; Q. Zhao ; J. F. Mitchell ; J. W. Allen ; B. J. Kim
American Association for the Advancement of Science (AAAS)
Published 2014Staff ViewPublication Date: 2014-06-14Publisher: American Association for the Advancement of Science (AAAS)Print ISSN: 0036-8075Electronic ISSN: 1095-9203Topics: BiologyChemistry and PharmacologyComputer ScienceMedicineNatural Sciences in GeneralPhysicsPublished by: -
5Latest Papers from Table of Contents or Articles in PressKim, H., Wang, K., Nakajima, Y., Hu, R., Ziemak, S., Syers, P., Wang, L., Hodovanets, H., Denlinger, J. D., Brydon, P. M. R., Agterberg, D. F., Tanatar, M. A., Prozorov, R., Paglione, J.
American Association for the Advancement of Science (AAAS)
Published 2018Staff ViewPublication Date: 2018-04-07Publisher: American Association for the Advancement of Science (AAAS)Electronic ISSN: 2375-2548Topics: Natural Sciences in GeneralPublished by: -
6Articles: DFG German National LicensesDenlinger, J. D. ; Rotenberg, E. ; Warwick, T. ; Visser, G. ; Nordgren, J. ; Guo, J.-H. ; Skytt, P. ; Kevan, S. D. ; McCutcheon, K. S. ; Shuh, D. ; Bucher, J. ; Edelstein, N. ; Tobin, J. G. ; Tonner, B. P.
[S.l.] : American Institute of Physics (AIP)
Published 1995Staff ViewISSN: 1089-7623Source: AIP Digital ArchiveTopics: PhysicsElectrical Engineering, Measurement and Control TechnologyNotes: The SpectroMicroscopy Facility at the Advanced Light Source is based on a high brightness, high-resolution beamline, and includes a collection of projects designed to exploit the unique characteristics of the soft x-ray beam. The beamline itself is comprised of a 5-m long, 5-cm-period undulator, a spherical-grating monochromator with water-cooled gratings. Adaptive optics refocus the monochromatic beam to two "microfocus'' experimental stations with spot sizes less than 50 μm diameter and a third "nanofocus'' station uses a zone-plate lens to further demagnify the microfocus spot. Experimental stations include an "ultraESCA'' spectrometer for small-area spectroscopy and photoelectron diffraction, a scanning transmission x-ray microscope, and photoelectron microscopes. Commissioning experiments of microscopic actinide photoemission, surface-core-level photoelectron diffraction, and high-resolution soft x-ray fluorescence demonstrate dramatic improvements in sensitivity due to the high brightness and small focus of the beamline. © 1995 American Institute of Physics.Type of Medium: Electronic ResourceURL: -
7Articles: DFG German National LicensesTobin, J. G. ; Goodman, K. W. ; Mankey, G. J. ; Willis, R. F. ; Denlinger, J. D. ; Rotenberg, E. ; Warwick, A.
[S.l.] : American Institute of Physics (AIP)
Published 1996Staff ViewISSN: 1089-7550Source: AIP Digital ArchiveTopics: PhysicsNotes: The magnetic structure of nanoscale alloy films has been probed using the magnetic x-ray linear dichroism in photoelectron spectroscopy. FeNi and CoFe epitaxial films were grown on Cu(001), in situ and using molecular beam epitaxy techniques. The magnetic x-ray linear dichroism measurements were made at the Spectromicroscopy Facility of the Third Generation Advanced Light Source. Because soft x-rays were used to generate photoemission from the 3p core levels, both elemental selectivity and magnetic sensitivity were achieved simultaneously. © 1996 American Institute of Physics.Type of Medium: Electronic ResourceURL: -
8Articles: DFG German National LicensesDenlinger, J. D. ; Rotenberg, Eli ; Hessinger, Uwe ; Leskovar, M. ; Olmstead, Marjorie A.
Woodbury, NY : American Institute of Physics (AIP)
Published 1993Staff ViewISSN: 1077-3118Source: AIP Digital ArchiveTopics: PhysicsNotes: Chemical discrimination of bulk and interface Ca 2p x-ray photoelectron diffraction modulations is used to identify three growth regimes during the initial stages of CaF2 epitaxy on Si(111). Low flux, high temperature conditions produce island growth atop a nonwetting, chemically reacted Ca-F interface layer. Changing the growth kinetics by increasing the flux produces more laminar growth. Lowering the substrate temperature produces a more stoichiometric CaF2 interface layer that results in immediate wetting and laminar growth.Type of Medium: Electronic ResourceURL: