Search Results - (Author, Cooperation:G. Goeminne)

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  1. 1
    R. Vanholme ; I. Cesarino ; K. Rataj ; Y. Xiao ; L. Sundin ; G. Goeminne ; H. Kim ; J. Cross ; K. Morreel ; P. Araujo ; L. Welsh ; J. Haustraete ; C. McClellan ; B. Vanholme ; J. Ralph ; G. G. Simpson ; C. Halpin ; W. Boerjan
    American Association for the Advancement of Science (AAAS)
    Published 2013
    Staff View
    Publication Date:
    2013-08-21
    Publisher:
    American Association for the Advancement of Science (AAAS)
    Print ISSN:
    0036-8075
    Electronic ISSN:
    1095-9203
    Topics:
    Biology
    Chemistry and Pharmacology
    Computer Science
    Medicine
    Natural Sciences in General
    Physics
    Keywords:
    Arabidopsis/*enzymology/genetics ; Arabidopsis Proteins/*chemistry/genetics ; Carboxylic Ester Hydrolases/*chemistry/genetics ; Glucose/chemistry ; Lignin/*biosynthesis ; Metabolic Networks and Pathways ; Mutation ; Shikimic Acid/chemistry ; Substrate Specificity
    Published by:
    http://www.aaas.org/

    Latest Papers from Table of Contents or Articles in Press
  2. 2
    Goeminne, G. ; De Laet, J. ; Terryn, H. ; Vereecken, J.

    Chichester [u.a.] : Wiley-Blackwell
    Published 1994
    Staff View
    ISSN:
    0142-2421
    Keywords:
    Chemistry ; Polymer and Materials Science
    Source:
    Wiley InterScience Backfile Collection 1832-2000
    Topics:
    Physics
    Notes:
    Non-destructive optical investigations (SE and FTIRS) of chromium phosphate conversion layers on aluminium are correlated to AES and TEM investigations. The AES results support the duplex model of the structure. FTIR-spectra provide a non-destructive characterization in agreement with the Auger data. Fitting the SE-data with a proper model makes it possible to determine the thickness accurately. A correlation is made between the thickness obtained with SE, FTIRS and AES. It is shown that for thin layers a good agreement is obtained.
    Additional Material:
    4 Ill.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1002/sia.740220195

    Articles: DFG German National Licenses