Search Results - (Author, Cooperation:G. Goeminne)
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1R. Vanholme ; I. Cesarino ; K. Rataj ; Y. Xiao ; L. Sundin ; G. Goeminne ; H. Kim ; J. Cross ; K. Morreel ; P. Araujo ; L. Welsh ; J. Haustraete ; C. McClellan ; B. Vanholme ; J. Ralph ; G. G. Simpson ; C. Halpin ; W. Boerjan
American Association for the Advancement of Science (AAAS)
Published 2013Staff ViewPublication Date: 2013-08-21Publisher: American Association for the Advancement of Science (AAAS)Print ISSN: 0036-8075Electronic ISSN: 1095-9203Topics: BiologyChemistry and PharmacologyComputer ScienceMedicineNatural Sciences in GeneralPhysicsKeywords: Arabidopsis/*enzymology/genetics ; Arabidopsis Proteins/*chemistry/genetics ; Carboxylic Ester Hydrolases/*chemistry/genetics ; Glucose/chemistry ; Lignin/*biosynthesis ; Metabolic Networks and Pathways ; Mutation ; Shikimic Acid/chemistry ; Substrate SpecificityPublished by: -
2Goeminne, G. ; De Laet, J. ; Terryn, H. ; Vereecken, J.
Chichester [u.a.] : Wiley-Blackwell
Published 1994Staff ViewISSN: 0142-2421Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: PhysicsNotes: Non-destructive optical investigations (SE and FTIRS) of chromium phosphate conversion layers on aluminium are correlated to AES and TEM investigations. The AES results support the duplex model of the structure. FTIR-spectra provide a non-destructive characterization in agreement with the Auger data. Fitting the SE-data with a proper model makes it possible to determine the thickness accurately. A correlation is made between the thickness obtained with SE, FTIRS and AES. It is shown that for thin layers a good agreement is obtained.Additional Material: 4 Ill.Type of Medium: Electronic ResourceURL: