Search Results - (Author, Cooperation:D. Heinen)

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  1. 1
    Dipika Gupta, Bo Lin, Ann Cowan, Christopher D. Heinen
    National Academy of Sciences
    Published 2018
    Staff View
    Publication Date:
    2018-02-14
    Publisher:
    National Academy of Sciences
    Print ISSN:
    0027-8424
    Electronic ISSN:
    1091-6490
    Topics:
    Biology
    Medicine
    Natural Sciences in General
    Published by:
    http://www.nasonline.org/

    Latest Papers from Table of Contents or Articles in Press
  2. 2
    M. G. Aartsen ; R. Abbasi ; Y. Abdou ; M. Ackermann ; J. Adams ; J. A. Aguilar ; M. Ahlers ; D. Altmann ; J. Auffenberg ; X. Bai ; M. Baker ; S. W. Barwick ; V. Baum ; R. Bay ; J. J. Beatty ; S. Bechet ; J. Becker Tjus ; K. H. Becker ; M. L. Benabderrahmane ; S. BenZvi ; P. Berghaus ; D. Berley ; E. Bernardini ; A. Bernhard ; D. Bertrand ; D. Z. Besson ; G. Binder ; D. Bindig ; M. Bissok ; E. Blaufuss ; J. Blumenthal ; D. J. Boersma ; S. Bohaichuk ; C. Bohm ; D. Bose ; S. Boser ; O. Botner ; L. Brayeur ; H. P. Bretz ; A. M. Brown ; R. Bruijn ; J. Brunner ; M. Carson ; J. Casey ; M. Casier ; D. Chirkin ; A. Christov ; B. Christy ; K. Clark ; F. Clevermann ; S. Coenders ; S. Cohen ; D. F. Cowen ; A. H. Cruz Silva ; M. Danninger ; J. Daughhetee ; J. C. Davis ; M. Day ; C. De Clercq ; S. De Ridder ; P. Desiati ; K. D. de Vries ; M. de With ; T. DeYoung ; J. C. Diaz-Velez ; M. Dunkman ; R. Eagan ; B. Eberhardt ; B. Eichmann ; J. Eisch ; R. W. Ellsworth ; S. Euler ; P. A. Evenson ; O. Fadiran ; A. R. Fazely ; A. Fedynitch ; J. Feintzeig ; T. Feusels ; K. Filimonov ; C. Finley ; T. Fischer-Wasels ; S. Flis ; A. Franckowiak ; K. Frantzen ; T. Fuchs ; T. K. Gaisser ; J. Gallagher ; L. Gerhardt ; L. Gladstone ; T. Glusenkamp ; A. Goldschmidt ; G. Golup ; J. G. Gonzalez ; J. A. Goodman ; D. Gora ; D. T. Grandmont ; D. Grant ; A. Gross ; C. Ha ; A. Haj Ismail ; P. Hallen ; A. Hallgren ; F. Halzen ; K. Hanson ; D. Heereman ; D. Heinen ; K. Helbing ; R. Hellauer ; S. Hickford ; G. C. Hill ; K. D. Hoffman ; R. Hoffmann ; A. Homeier ; K. Hoshina ; W. Huelsnitz ; P. O. Hulth ; K. Hultqvist ; S. Hussain ; A. Ishihara ; E. Jacobi ; J. Jacobsen ; K. Jagielski ; G. S. Japaridze ; K. Jero ; O. Jlelati ; B. Kaminsky ; A. Kappes ; T. Karg ; A. Karle ; J. L. Kelley ; J. Kiryluk ; J. Klas ; S. R. Klein ; J. H. Kohne ; G. Kohnen ; H. Kolanoski ; L. Kopke ; C. Kopper ; S. Kopper ; D. J. Koskinen ; M. Kowalski ; M. Krasberg ; K. Krings ; G. Kroll ; J. Kunnen ; N. Kurahashi ; T. Kuwabara ; M. Labare ; H. Landsman ; M. J. Larson ; M. Lesiak-Bzdak ; M. Leuermann ; J. Leute ; J. Lunemann ; J. Madsen ; G. Maggi ; R. Maruyama ; K. Mase ; H. S. Matis ; F. McNally ; K. Meagher ; M. Merck ; T. Meures ; S. Miarecki ; E. Middell ; N. Milke ; J. Miller ; L. Mohrmann ; T. Montaruli ; R. Morse ; R. Nahnhauer ; U. Naumann ; H. Niederhausen ; S. C. Nowicki ; D. R. Nygren ; A. Obertacke ; S. Odrowski ; A. Olivas ; A. O'Murchadha ; L. Paul ; J. A. Pepper ; C. Perez de los Heros ; C. Pfendner ; D. Pieloth ; E. Pinat ; J. Posselt ; P. B. Price ; G. T. Przybylski ; L. Radel ; M. Rameez ; K. Rawlins ; P. Redl ; R. Reimann ; E. Resconi ; W. Rhode ; M. Ribordy ; M. Richman ; B. Riedel ; J. P. Rodrigues ; C. Rott ; T. Ruhe ; B. Ruzybayev ; D. Ryckbosch ; S. M. Saba ; T. Salameh ; H. G. Sander ; M. Santander ; S. Sarkar ; K. Schatto ; F. Scheriau ; T. Schmidt ; M. Schmitz ; S. Schoenen ; S. Schoneberg ; A. Schonwald ; A. Schukraft ; L. Schulte ; O. Schulz ; D. Seckel ; Y. Sestayo ; S. Seunarine ; R. Shanidze ; C. Sheremata ; M. W. Smith ; D. Soldin ; G. M. Spiczak ; C. Spiering ; M. Stamatikos ; T. Stanev ; A. Stasik ; T. Stezelberger ; R. G. Stokstad ; A. Stossl ; E. A. Strahler ; R. Strom ; G. W. Sullivan ; H. Taavola ; I. Taboada ; A. Tamburro ; A. Tepe ; S. Ter-Antonyan ; G. Tesic ; S. Tilav ; P. A. Toale ; S. Toscano ; E. Unger ; M. Usner ; N. van Eijndhoven ; A. Van Overloop ; J. van Santen ; M. Vehring ; M. Voge ; M. Vraeghe ; C. Walck ; T. Waldenmaier ; M. Wallraff ; C. Weaver ; M. Wellons ; C. Wendt ; S. Westerhoff ; N. Whitehorn ; K. Wiebe ; C. H. Wiebusch ; D. R. Williams ; H. Wissing ; M. Wolf ; T. R. Wood ; K. Woschnagg ; D. L. Xu ; X. W. Xu ; J. P. Yanez ; G. Yodh ; S. Yoshida ; P. Zarzhitsky ; J. Ziemann ; S. Zierke ; M. Zoll
    American Association for the Advancement of Science (AAAS)
    Published 2013
    Staff View
    Publication Date:
    2013-11-23
    Publisher:
    American Association for the Advancement of Science (AAAS)
    Print ISSN:
    0036-8075
    Electronic ISSN:
    1095-9203
    Topics:
    Biology
    Chemistry and Pharmacology
    Computer Science
    Medicine
    Natural Sciences in General
    Physics
    Published by:
    http://www.aaas.org/

    Latest Papers from Table of Contents or Articles in Press
  3. 3
    Heinen, D. ; Bohn, H. G. ; Schilling, W.

    [S.l.] : American Institute of Physics (AIP)
    Published 1995
    Staff View
    ISSN:
    1089-7550
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    The internal friction of a 4 μm thick free-standing Al film has been investigated. For a measuring frequency of about 200 Hz a relaxation peak was found near 100 °C. Compared with a substrate-bonded film having the same columnar microstructure the peak is about three times higher while the temperature position is the same. This result confirms a model derived for substrate-bonded films which predicts that intrinsic grain boundary sliding controls the relaxation mechanism. The film/substrate-bonding only influences the peak height. It partly hinders the grain boundary sliding thereby reducing the relaxation strength. © 1995 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.360279

    Articles: DFG German National Licenses
  4. 4
    Heinen, D. ; Bohn, H. G. ; Schilling, W.

    [S.l.] : American Institute of Physics (AIP)
    Published 1995
    Staff View
    ISSN:
    1089-7550
    Source:
    AIP Digital Archive
    Topics:
    Physics
    Notes:
    Free-standing 4-μm-thick Al thin films were prepared by partially removing the Si substrate after deposition of the film. The tensile film stress was determined from the membrane vibration frequency in the temperature range between room temperature and −190 °C. The flow stress of the free-standing films is compared to that of substrate-bonded ones deposited under identical conditions thus having basically the same microstructure. It was found that the flow stress of the unsupported films agrees with that of bulk Al (when extrapolated to the same grain size of 1–4 μm) being considerably smaller than that of substrate bonded films. This directly proves the importance of the film/substrate interface for the yield strength of substrate-bonded metallic films supporting existing theoretical models. © 1995 American Institute of Physics.
    Type of Medium:
    Electronic Resource
    URL:
    http://dx.doi.org/10.1063/1.358546

    Articles: DFG German National Licenses