Search Results - (Author, Cooperation:D. F. Mitchell)
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1Latest Papers from Table of Contents or Articles in PressB. M. Jakosky ; J. M. Grebowsky ; J. G. Luhmann ; J. Connerney ; F. Eparvier ; R. Ergun ; J. Halekas ; D. Larson ; P. Mahaffy ; J. McFadden ; D. F. Mitchell ; N. Schneider ; R. Zurek ; S. Bougher ; D. Brain ; Y. J. Ma ; C. Mazelle ; L. Andersson ; D. Andrews ; D. Baird ; D. Baker ; J. M. Bell ; M. Benna ; M. Chaffin ; P. Chamberlin ; Y. Y. Chaufray ; J. Clarke ; G. Collinson ; M. Combi ; F. Crary ; T. Cravens ; M. Crismani ; S. Curry ; D. Curtis ; J. Deighan ; G. Delory ; R. Dewey ; G. DiBraccio ; C. Dong ; Y. Dong ; P. Dunn ; M. Elrod ; S. England ; A. Eriksson ; J. Espley ; S. Evans ; X. Fang ; M. Fillingim ; K. Fortier ; C. M. Fowler ; J. Fox ; H. Groller ; S. Guzewich ; T. Hara ; Y. Harada ; G. Holsclaw ; S. K. Jain ; R. Jolitz ; F. Leblanc ; C. O. Lee ; Y. Lee ; F. Lefevre ; R. Lillis ; R. Livi ; D. Lo ; M. Mayyasi ; W. McClintock ; T. McEnulty ; R. Modolo ; F. Montmessin ; M. Morooka ; A. Nagy ; K. Olsen ; W. Peterson ; A. Rahmati ; S. Ruhunusiri ; C. T. Russell ; S. Sakai ; J. A. Sauvaud ; K. Seki ; M. Steckiewicz ; M. Stevens ; A. I. Stewart ; A. Stiepen ; S. Stone ; V. Tenishev ; E. Thiemann ; R. Tolson ; D. Toublanc ; M. Vogt ; T. Weber ; P. Withers ; T. Woods ; R. Yelle
American Association for the Advancement of Science (AAAS)
Published 2015Staff ViewPublication Date: 2015-11-07Publisher: American Association for the Advancement of Science (AAAS)Print ISSN: 0036-8075Electronic ISSN: 1095-9203Topics: BiologyChemistry and PharmacologyComputer ScienceMedicineNatural Sciences in GeneralPhysicsPublished by: -
2Articles: DFG German National LicensesLu, Z. H. ; Mitchell, D. F. ; Graham, M. J.
Woodbury, NY : American Institute of Physics (AIP)
Published 1994Staff ViewISSN: 1077-3118Source: AIP Digital ArchiveTopics: PhysicsNotes: In situ x-ray photoelectron spectroscopy has been used to analyze the nature and extent of damage to the Si(100) surfaces bombarded with xenon ions in the energy range 0.25–2 keV. Dramatic changes in the Si 2p core levels were found upon ion bombardment. A curve-fitting analysis of the core level shows that an amorphous silicon overlayer is formed on the Xe+ ion bombarded surface. The results indicate that these low-energy Xe+ ions amorphize the surface in a layer-by-layer manner and that the depth of damage increases rapidly for ion doses between 1013 and 1015 ions cm−2. At about 1015 ions cm−2 the damage depth reaches a saturation for all ion energies studied. The saturated damage depth is found to increase linearly with ion energy.Type of Medium: Electronic ResourceURL: -
3Articles: DFG German National LicensesBlyth, P. J. ; Kadri, S. ; Valdimarsson, S. K. ; Mitchell, D. F. ; Purser, G. J.
Oxford, UK : Blackwell Science Ltd
Published 1999Staff ViewISSN: 1365-2109Source: Blackwell Publishing Journal Backfiles 1879-2005Topics: Agriculture, Forestry, Horticulture, Fishery, Domestic Science, NutritionNotes: Atlantic salmon, Salmo salar L., in sea cages exhibit feeding patterns that vary both diurnally and seasonally. Hitherto, there are no data reporting feed rate and its variation through a complete annual cycle. Here we present data from Scotland showing diurnal and interseasonal variation in feeding patterns and feeding rates of Atlantic salmon fed daily to satiation from shortly after transfer to seawater until harvest about 11 months later. A major feeding peak regularly occurred soon after dawn, and feeding rates remained high for approximately one hour. Over the remainder of the day, the fish fed at a lower but steady rate. Relative feed intake varied over the trial, being initially high in summer followed by a sharp decline in autumn, and then further declining until fish reached harvest size at the beginning of the following summer. Further investigations of the relationship between variation in circannual feeding patterns and environmental parameters should now be carried out to improve the understanding of the mechanism behind these patterns.Type of Medium: Electronic ResourceURL: -
4Articles: DFG German National LicensesStaff View
ISSN: 0004-8402Topics: PhilosophyNotes: REVIEWS AND NOTICES OF BOOKSURL: -
5Articles: DFG German National LicensesStaff View
ISSN: 1573-4889Keywords: oxidation ; segregation ; impurities ; CeO2-coated Fe-20CrSource: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsNotes: Abstract The interfacial segregation of sulphur and carbon during the oxidation in 1 torr O2 at 1173 K of Fe-20Cr alloy, which was either free of Ce, alloyed with 0.078 wt.% Ce, or sputter-coated with a 4 nm-thick CeO2 layer, was studied using polyatomic SIMS. Oxidation periods were up to 19 hr. During oxidation, sulphur and carbon accumulated at the alloy-oxide interface region of both uncoated and coated alloys. The amount of segregated sulphur did not vary appreciably with time, whereas carbon increased with time. The total amount of segregants was similar for both uncoated and coated alloys, although the scales formed on the sputter-coated alloy maintained adhesion and were about 10 times thinner than those on the uncoated alloys.Type of Medium: Electronic ResourceURL: -
6Articles: DFG German National LicensesCotell, C. M. ; Yurek, G. J. ; Hussey, R. J. ; Mitchell, D. F. ; Graham, M. J.
Springer
Published 1990Staff ViewISSN: 1573-4889Keywords: oxidation mechanisms, Cr2O3 ; 18O/SIMS ; grain-boundary segregation ; yttrium implantation ; reactive-element effectSource: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsNotes: Abstract The oxidation behavior of pure Cr and Cr implanted with Y was studied as a function of temperature (900 and 1025°C) and ion-implantation dose (1×1015 and 2×1016 Y ions/cm2). The microstructures of the Cr2O3 scales were affected by both of the variables studied. Yttrium ions segregated at the grain boundaries in the Cr2O3 scales formed on the implanted alloys and the concentration of Y at the grain boundaries decreased with a decrease in the dose of implanted Y. The mechanism of growth of the Cr2O3 scales was altered by the presence of the Y ions at the Cr2O3 grain boundaries only when a critical concentration of Y at the grain boundaries was exceeded.Type of Medium: Electronic ResourceURL: -
7Articles: DFG German National LicensesStaff View
ISSN: 1573-4889Keywords: aluminum oxidation ; single crystals ; 18O/SIMS ; transport mechanismsSource: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsNotes: Abstract Oxygen transport during oxide growth on (110), (111), and (100) Al crystals at 550°C is investigated by18O/SIMS combined with kinetic measurements and SEM and TEM observations. Starting with an electropolished surface, the experimental evidence suggests oxide growth by oxygen anion transport via local pathways through an outer amorphous Al2O3 layer and oxygen incorporation at the periphery of the underlying laterally growing γ-Al2O3 islands. The kinetics, island morphology and epitaxy are sensitive to substrate orientation. This oxide growth behavior is compared with oxide formation on a sputter-cleaned and annealed (111) Al surface.Type of Medium: Electronic ResourceURL: -
8Articles: DFG German National LicensesStaff View
ISSN: 1573-4889Keywords: Rutherford backscattering ; Fe-24Cr Y-implantation ; Cr2O3 ; cation diffusionSource: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsNotes: Abstract We have investigated the effect of Y ion implantation on the high-Temperature oxidation of Fe-24Cr using Rutherford-backscattering spectroscopy, secondary ion mass spectroscopy, and analytical electron microscopy. Results indicate that implantation of Y has a very large effect on the growth rate of the oxide compared to metals alloyed with Y. Analytical tools have been applied to determine the spatial distribution of Y, the microstructure of the oxide, and contribution of oxygen transport to the oxidation process. Results are compared with those of recent cation-diffusion measurements in Cr2O3 and Cr2O3 doped with Y2O3.Type of Medium: Electronic ResourceURL: -
9Articles: DFG German National LicensesStaff View
ISSN: 1573-4889Keywords: oxidation ; iron ; magnetite ; oxide thickness ; electron back-scattering Mössbauer spectroscopySource: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsNotes: Abstract Magnetite films in the range 265–4520 Å have been grown on natural iron substrates and subsequently investigated by electron back-scattering Mössbauer spectroscopy. In particular, the percentage, P, of the total spectrum area contributed by the oxide has been determined as a function of oxide thickness, d. It was found that d up to ≈ 3000Å may be expressed (to an accuracy of ∼ 5%) by d (Å)=−1.95 × 103 ln (1–0.01 P). The experimental data have been compared with the theoretical predictions of both Huffman and Bainbridge. Good agreement between experiment and Huffman's predictions of P is obtained using values of the electron attenuation coefficient, μ, of 1.10 × 104 cm2 g−1 for the 7.3 keV electrons and 1.73 × 104 cm2 g−1 for the 5.4 keV electrons. A good fit of our data to Bainbridge's expression requires a somewhat lower effective μ, value of 0.8 × 104 cm2 g−1. The experimental P value for the thickest oxide (4520 Å) is lower than the theoretical predictions, probably as a result of a neglected mechanism recently identified by Tricker, Ash, and Cranshaw.Type of Medium: Electronic ResourceURL: -
10Articles: DFG German National LicensesStaff View
ISSN: 1573-4889Keywords: Fe-Cr ; oxidation ; kinetics ; oxide morphologySource: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsNotes: Abstract Ferritic polycrystalline Fe-24 wt.% Cr was oxidized in pure oxygen at 190 ≤ T≤490° C and pressures in the range 5.3×10−2–13.3 Pa for periods of up to 5 hr. The reaction proceeded in three stages. An initial period of accelerating rate was accompanied by oxide island nucleation and growth. Following island coalescence the rate was approximately logarithmic at low temperatures and somewhat slower than parabolic at high temperatures. Rate control during this period was thought to be due to mass transport through the oxide grain boundaries left by the island impingement process. During these first two stages the oxide formed was γ-M2O3 with possibly some spinel. The final stage of reaction involved the appearance of α-M2O3 on the outer oxide surface and a substantial slowing of the oxidation rate due to the low diffusivity in this phase.Type of Medium: Electronic ResourceURL: -
11Articles: DFG German National LicensesCotell, C. M. ; Yurek, G. J. ; Hussey, R. J. ; Mitchell, D. F. ; Graham, M. J.
Springer
Published 1990Staff ViewISSN: 1573-4889Keywords: oxidation mechanisms ; grain-boundary segregation ; Cr2O3 ; 18O/SIMS ; yttrium implantation ; reactive-element effectSource: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsNotes: Abstract The oxidation behavior at 900°C of pure Cr and Cr implanted with 2×1016 Y ions/cm2 was studied. The kinetics of oxidation were measured thermogravimetrically and manometrically. The mechanisms of oxide growth were studied using18O-tracer oxidation experiments, and the composition and microstructure of the oxide scales were characterized by TEM and STEM. Segregation of Y cations at Cr2O3 grain boundaries was found to be the critical factor governing changes in the oxidation behavior of Cr upon the addition of Y. In the absence of Y, pure Cr oxidized by the outward diffusion of cations via grain boundaries in the Cr2O3 scale. When Y was present at high concentration in the scale, as when Cr implanted with 2×1010 Y ions/cm2 was oxidized, anion diffusion predominated. It is concluded that strain-induced segregation of Y at grain boundaries in the oxide reduced the cation flux along the grain boundaries. The rate of oxidation was reduced because the grain-boundary diffusivity of cations became lower than the grain-boundary diffusivity of the anions, which then controlled the rate of oxidation. Changes in the relative rates of Cr3+ and O2− transport, as well as a solute-drag effect exerted by Y on the oxide grain boundaries, resulted in changes in the microstructure of the oxide.Type of Medium: Electronic ResourceURL: -
12Articles: DFG German National LicensesSlobodskaja, T. M. ; Demann, W. ; TerNedden, W. ; Woitowa, J. W. ; Black, C. G. ; Jäppelt, A. ; Vukadinović, M. ; Brennan, J. J. ; Mitchell, D. F. ; Tierney, F. P. ; Thompson, W. C. ; Dolgow, G. ; Galilejewa, J. A. ; Lonskaja, M. P.
Springer
Published 1938Staff ViewISSN: 1618-2650Source: Springer Online Journal Archives 1860-2000Topics: Chemistry and PharmacologyType of Medium: Electronic ResourceURL: -
13Articles: DFG German National LicensesStaff View
ISSN: 1573-4803Source: Springer Online Journal Archives 1860-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsNotes: Abstract In many experiments involving the high temperature oxidation of nickel in fused silica reaction vessels the final oxidation products have been found to include silica as β-cristobalite. Prior to oxidation the nickel was decarburized by exposure to oxygen followed by hydrogen reduction of the remaining oxide film. The silicon of the silica was transferred from the vessel walls to the specimen as silicon monoxide formed by the reduction of the silica by the carbon monoxide produced during the decarburization step. The silicon monoxide was reduced at the metal specimen by residual carbon to form silicon which then dissolved in the nickel. Detectable contamination of the surface took place during subsequent oxidation when the silicon was preferentially oxidized at the surface. The reaction of carbon monoxide with the silica tube was enhanced by devitrification caused by previous high temperature (〉 700° C) treatment. Contamination could be avoided if the tube was never heated above 700° C and was minimized at 900° C by more complete decarburization of the specimen.Type of Medium: Electronic ResourceURL: -
14Articles: DFG German National LicensesStaff View
ISSN: 0947-5117Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsDescription / Table of Contents: Wachstum und Gefüge von Oxidschichten auf einkristallinem (100) und polykristallinem Chrom zwischen 550 und 900 °CDie Oxidation von polykristallinem und (100)-Cr bei Temperaturen zwischen 550 und 900°C und Sauerstoffbrücken zwischen 5 × 10-3 und 5 × 10-1 torr (bei Verwendung von Oberflächenvorbehandlungen, welche die ausschließliche Bildung von festhaftendem einheitlichem, porenfreiem polykristallinem α-Cr2O3 gewährleisten) folgt langzeitig einem parabolischen Zeitgesetz mit einer Aktivierungsenergie von etwa 51 kcal mol-1. Die durch aufeinanderfolgende Oxidation in 18O2 und 16O2 erzeugten Oxidschichten konnten mittels polyatomarer SIMS analysiert werden, so daß das Ausmaß des Sauerstofftransports in den wachsenden Oxidschichten und der Wachstumsmechanismus geklärt werden konnten. Die Ergebnisse zeigten, daß der dominierende Wachstumsmechanismus der Kationentransport nach außen ist und nur ein kleiner, jedoch nicht zu vernachlässigender Transport an Sauerstoff entlang der Oxidkorngrenzen nach innen erfolgt. Etwa 1% des Oxids entsteht innerhalb der Zunderschicht durch diese Diffusion nach innen. Die Diffusionskoeffizienten von Sauerstoff waren um mehrere Größenordnungen höher als die Selbstdiffusionskoeffizienten des Sauerstoffs in Cr2O3, doch waren sie immer noch weitaus zu niedrig, um die beobachteten Oxidationsgeschwindigkeiten erklären zu können.Notes: The oxidation of polycrystalline and (100) Cr at temperatures from 550-900°C and 5 × 10-3 to 5 × 10-1 torr oxygen pressure, choosing surface pretreatments such that only adherent, uniform, pore-free polycrystalline α-Cr2O3 is produced, show long term parabolic growth kinetics with an activation energy ∽ 51 kcal mol-1. Oxide layers, produced by sequential oxidation in 18O2 and 16O2, were suitable for the application of polyatomic SIMS to elucidate the extent of oxygen transport in the growing oxides and the mechanism for their growth. The data show that the predominant growth mechanism is by outward cation transport, with a small yet significant amount of inward oxygen diffusion down oxide grain boundaries. ∽ 1% of the oxide is created within the film as a result of this inward diffusion. Oxygen diffusion coefficients were found to be orders of magnitude higher than oxygen self diffusion coefficients in Cr2O3 but much too low to account for the observed oxidation rates.Additional Material: 9 Ill.Type of Medium: Electronic ResourceURL: -
15Articles: DFG German National LicensesJedliński, J. ; Bernasik, A. ; Graham, M. J. ; Mitchell, D. F. ; Sproule, G. I. ; Borchardt, G.
Weinheim [u.a.] : Wiley-Blackwell
Published 1995Staff ViewISSN: 0947-5117Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: Mechanical Engineering, Materials Science, Production Engineering, Mining and Metallurgy, Traffic Engineering, Precision MechanicsDescription / Table of Contents: Ein gemeinsamer Ansatz: Isotopische Exposition/SIMS-Analyse/REM zur Untersuchung des Anfangsstadiums der Oxidation von β-NiAL bei 1473 KDas Anfangsstadium der Oxidation von β-NiAl wurde bei 1473 K an unmodifiziertem Material und nach Y-Implantation untersucht. Hierzu wurde die 16O/18O-Zwei-Stufen-Oxidation in Kombination mit hochauflösender Sekundärionenmassenspektrometrie (SIMS) sowie Rasterelektronenmikroskopie (REM) eingesetzt. Es zeigt sich, daß die gebildeten Oxidschichten hinsichtlich der Zusammensetzung und des Gefüges nicht homogen sind. Deswegen war es erforderlich, analytische Methoden (SIMS und REM) mit sehr hoher Ortsauflösung bei höchstmöglicher Empfindlichkeit zu verwenden. Dadurch konnten die unterschiedlichen Wachstumsmechanismen in den einzelnen Bereichen der Oxidschicht auf den beiden verschiedenen Substrattypen identifiziert werden.Notes: The early oxidation stages of unmodified and yttrium-implanted β-NiAl have been studied at 1473 K using sequential isotopic exposure (so-called two-stage oxidation) combined with low and high resolution SIMS analysis and SEM characterization.The scales growing on unmodified material comprised typically a cracked morphology with oxide ridges growing outward from the cracks. Some ridges were formed at the reaction temperature during the first oxidation stage and continued growing during the second stage. This resulted in a network of ridges on the outer surface of the scale.Two regions: non-cracked areas and cracked round patches were observed in the scale on yttrium-implanted β-NiAl. No ridges but thin lace-like oxide was formed in cracks and round particles extruded from some crack centres. No network was formed by the lace-like oxide. Inward oxygen transport contributed significantly to the overall matter transport in the patches, while its contribution in the remaining scale was much less pronounced. The very thin outermost layer of most patches was enriched in Cr, which was present at a level of ca. 90 ppm only in the starting material. This finding is discussed in terms of the effect of Cr on the phase transformation of unstable aluminas into the stable β-Al2O3.The results showed that the scales were inhomogeneous regarding both composition and microstructure. Therefore, only analytical methods having respectable sensitivity and resolution might be used to give reliable information regarding the growth mechanisms of scales. This applies to SIMS as well as to the electron microscopy methods.Additional Material: 14 Ill.Type of Medium: Electronic ResourceURL: -
16Articles: DFG German National LicensesStaff View
ISSN: 0142-2421Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: PhysicsNotes: Quantification of the magnitude of preferential sputtering of oxygen from metallic oxides has been examined for a large number of 30 nm thick amorphous oxides deposited onto polished silicon substrates. The method of analysis was derivative-mode Auger analysis carried out in a cleaner vacuum system and with cleaner initial surfaces than has been the case usually for data found in the literature. Ion sputtering was primarily with 3 keV xenon ions but the effect of ion energy (1, 3 and 4.5 keV), ion mass (argon or xenon) and sputter rate was also examined. The magnitude of preferential sputtering at 20°C was generally much less than has been reported previously and was not a function of ion energy, mass or sputter rate over the range studied. The results separate into two groups: oxides that reduce appreciably and those that do not. The results agree well with the predictions from the theoretical model of Kelly.1 It must be concluded from the work that most of the data reported in literature are primarily the result of unrecognized and therefore unreported variables. Likely candidates are contaminants within the ion beam and background environment that contribute chemical effects to the sputter process, ion beam and electron beam heating of poorly conducting samples, or redeposition of sputtered material into the analysis area.Additional Material: 2 Ill.Type of Medium: Electronic ResourceURL: -
17Articles: DFG German National LicensesMitchell, D. F. ; Arlow, J. S. ; Phillips, J. R. ; Sproule, G. I.
Chichester [u.a.] : Wiley-Blackwell
Published 1989Staff ViewISSN: 0142-2421Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: PhysicsNotes: A computer-driven ion beam deflection system is described. This system allows custom tailoring of the ion beam raster to optimize SIMS depth profile performance. The ion beam is deflected to produce an approximately elliptical crater, which better matches the acceptance geometry of the ion extraction optics. A crater with a larger and more evenly flat bottom is produced by varying the resident time of the ion beam within the raster area, thus allowing for the collection of more signal with better depth resolution. This is accomplished by creating an array of equally spaced sputter points on the sample, taking into account the orientation of the ion gun and the SIMS optics with respect to the sample normal. The resident time of the ion beam along the crater perimeter is extended and the raster and mass spectrometer are synchronized. The improvement in performance is shown using a strain layer superlattice test sample 720 nm thick, consisting of 40 double layers of Si/Si-30% Ge.Additional Material: 4 Ill.Type of Medium: Electronic ResourceURL: -
18Articles: DFG German National LicensesMitchell, D. F. ; Clark, K. B. ; Bardwell, J. A. ; Lennard, W. N. ; Massoumi, G. R. ; Mitchell, I. V.
Chichester [u.a.] : Wiley-Blackwell
Published 1994Staff ViewISSN: 0142-2421Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: PhysicsNotes: The preferred XPS methodology for measurement of SiO2 film thickness on polished silicon surfaces is discussed. A precise measurement of the photoelectron attenuation length was made using nuclear reaction analysis (NRA) to calibrate the film thicknesses. Anodic oxide films on Si, which are very reproducible in thickness, are used as test samples. Appropriate corrections for the problem of adventitious carbon are shown. Under some conditions, the phenomenon of photoelectron diffraction has a significant effect on the measurements, and improvements to the precision by rotating the sample about the normal during data acquisition are demonstrated.Additional Material: 7 Ill.Type of Medium: Electronic ResourceURL: -
19Articles: DFG German National LicensesStaff View
ISSN: 0142-2421Keywords: Chemistry ; Polymer and Materials ScienceSource: Wiley InterScience Backfile Collection 1832-2000Topics: PhysicsNotes: A comparison of three surface-analytical methods, viz: variable escape angle Auger electron spectroscopy, Auger sputter profiling and SIMS sputter profiling, is presented for a 1.8 nm-thick ‘passive’ oxide film on Fe-25% Cr alloy. The three techniques give identical results regarding the composition of the film as a function of depth. This means that with the proper choice of sputtering conditions (heavy ions of low energy), sputter mixing and sputter reduction are not a problem. It is evident from the experimental data that SIMS sputter profiling has the best depth resolution of the three techniques for such a thin film.Additional Material: 2 Ill.Type of Medium: Electronic ResourceURL: