A system for systematically preparing atom-probe field-ion-microscope specimens for the study of internal interfaces - Krakauer, B. W.; Hu, J. G.; Kuo, S.-M.; Mallick, R. L.; Seki, A.; Seidman, D. N.; Baker, J. P.; Loyd, R. J. (American Institute of Physics (AIP), 1990)
http://dx.doi.org/10.1063/1.1141590
Keywords: U; ZN