The combined use of a singly charged ion beam and undulator radiation for photoelectron spectrometry studies on atomic ions : Proceedings of the 4th international conference on synchrotron radiation instrumentation - Bizau, J. M.; Cubaynes, D.; Richter, M.; Wuilleumier, F.; Obert, J.; Putaux, J. C. (American Institute of Physics (AIP), 1992)
http://dx.doi.org/10.1063/1.1143077
Keywords: U; ZN