Fundamental investigation of reflectometry as a density fluctuation diagnostic (invited) : Proceedings of the 9th topical conference on high temperature plasma diagnostics - Rhodes, T. L.; Baang, S.; Chou, A. E.; Domier, C. W.; Luhmann, N. C.; Peebles, W. A. (American Institute of Physics (AIP), 1992)
http://dx.doi.org/10.1063/1.1143681
Keywords: U; ZN