An integrated scanning tunneling, atomic force and lateral force microscope
Wenzler, L. A. ; Han, T. ; Bryner, R. S. ; Beebe, T. P.
[S.l.] : American Institute of Physics (AIP)
Published 1994
[S.l.] : American Institute of Physics (AIP)
Published 1994
| ISSN: |
1089-7623
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
Electrical Engineering, Measurement and Control Technology
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| Notes: |
We describe the design and operation of a combined scanning tunneling–atomic force–lateral force microscope [(STM), (AFM), (LFM)]. Including these capabilities in a single instrument reduces construction costs and increases flexibility. AFM and LFM may be performed simultaneously; a simple reconfiguration (requiring removing the AFM/LFM cantilever holder and replacing with a STM tip) changes the instrument into a STM. We present atomic forces depicted in force-to-distance curves and experimental imaging applications with all three techniques.
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| Type of Medium: |
Electronic Resource
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| URL: |