Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devices - Chan, D. S. H.; Phang, J. C. H.; Chim, W. K.; Liu, Y. Y.; Tao, J. M. (American Institute of Physics (AIP), 1996)
http://dx.doi.org/10.1063/1.1147217
Keywords: U; ZN