Scanning force microscope and vacuum chamber for the study of ice films: Design and first results - Bluhm, H.; Pan, S. H.; Xu, L.; Inoue, T.; Ogletree, D. F.; Salmeron, M. (American Institute of Physics (AIP), 1998)
http://dx.doi.org/10.1063/1.1148841
Keywords: U; ZN