APA (7th ed.) Citation

Kim, C., & Michael, N. L. (2001). Efficient electromigration testing with a single current source. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Kim, Choong-Un, and N. L. Michael. Efficient Electromigration Testing with a Single Current Source. [S.l.]: American Institute of Physics (AIP), 2001.

MLA (9th ed.) Citation

Kim, Choong-Un, and N. L. Michael. Efficient Electromigration Testing with a Single Current Source. American Institute of Physics (AIP), 2001.