Electron diamagnetic drift effect on the trapped hot particle-driven resistive interchange mode

You, K.-I. ; Choi, D.-I. ; Kim, J.-Y.

[S.l.] : American Institute of Physics (AIP)
Published 1997

ISSN:	1089-7674
Source:	AIP Digital Archive
Topics:	Physics
Notes:	The linearized flux-surface-averaged resistive magnetohydrodynamic equations, which include the electron diamagnetic drift and hot particle effects, are derived and studied numerically. The effect of electron diamagnetic drift on the trapped hot particle-driven resistive interchange mode is then investigated. It is shown that the effect can have a strong stabilization effect on the mode, similar to the conventional resistive interchange mode case. © 1997 American Institute of Physics.
Type of Medium:	Electronic Resource
URL:	http://dx.doi.org/10.1063/1.872117