Chen, I. C., Holland, S., & Hu, C. (1987). Electron-trap generation by recombination of electrons and holes in SiO2. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationChen, I. C., S. Holland, and C. Hu. Electron-trap Generation by Recombination of Electrons and Holes in SiO2. [S.l.]: American Institute of Physics (AIP), 1987.
MLA (9th ed.) CitationChen, I. C., et al. Electron-trap Generation by Recombination of Electrons and Holes in SiO2. American Institute of Physics (AIP), 1987.
Warning: These citations may not always be 100% accurate.