Hg content and thermal stability of the anodic sulfide films on Hg1−xCdxTe investigated by 30–40-MeV O5+ ion backscattering - Ippo¯shi, T.; Takita, K.; Murakami, K.; Masuda, K.; Kudo, H.; Seki, S. (American Institute of Physics (AIP), 1988)
http://dx.doi.org/10.1063/1.340480
Keywords: U