Improved interface state density function in metal-semiconductor junctions by deep-level transient spectroscopy - Halder, N. C.; Kim, H. W.; D'Souza, K. M.; Barnes, D. E.; Hartson, S. E.; Mohapatra, R. (American Institute of Physics (AIP), 1991)
http://dx.doi.org/10.1063/1.348862
Keywords: U