APA (7th ed.) Citation

Duan, X. F., Du, A. Y., & Chu, Y. M. (1991). Transmission electron microscopy study of N+-implanted silicon on insulator by energy-filtered imaging. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Duan, X. F., A. Y. Du, and Y. M. Chu. Transmission Electron Microscopy Study of N+-implanted Silicon on Insulator by Energy-filtered Imaging. [S.l.]: American Institute of Physics (AIP), 1991.

MLA (9th ed.) Citation

Duan, X. F., et al. Transmission Electron Microscopy Study of N+-implanted Silicon on Insulator by Energy-filtered Imaging. American Institute of Physics (AIP), 1991.