APA (7th ed.) Citation

Lloyd, J. R., & Koch, R. H. (1992). Electromigration-induced vacancy behavior in unpassivated thin films. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Lloyd, J. R., and R. H. Koch. Electromigration-induced Vacancy Behavior in Unpassivated Thin Films. [S.l.]: American Institute of Physics (AIP), 1992.

MLA (9th ed.) Citation

Lloyd, J. R., and R. H. Koch. Electromigration-induced Vacancy Behavior in Unpassivated Thin Films. American Institute of Physics (AIP), 1992.