Characterization by Raman scattering, x-ray diffraction, and transmission electron microscopy of (AlAs)m(InAs)m short period superlattices grown by migration enhanced epitaxy - Bradshaw, J.; Song, X. J.; Shealy, J. R.; Zhu, J. G.; Østergaard, H. (American Institute of Physics (AIP), 1992)
http://dx.doi.org/10.1063/1.352139
Keywords: U