APA (7th ed.) Citation

Duan, X. F., & Fung, K. K. (1992). Diffraction characterization of totally relaxed, partially relaxed, and unrelaxed semiconductor strained-layer superlattices. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Duan, X. F., and K. K. Fung. Diffraction Characterization of Totally Relaxed, Partially Relaxed, and Unrelaxed Semiconductor Strained-layer Superlattices. [S.l.]: American Institute of Physics (AIP), 1992.

MLA (9th ed.) Citation

Duan, X. F., and K. K. Fung. Diffraction Characterization of Totally Relaxed, Partially Relaxed, and Unrelaxed Semiconductor Strained-layer Superlattices. American Institute of Physics (AIP), 1992.