Scanning Lorentz electron microscope with high resolution and observation of bit profiles recorded on sputtered longitudinal media (invited) : 37th Annual conference on magnetism and magnetic materials - Yajima, Y.; Takahashi, Y.; Takeshita, M.; Kobayashi, T.; Ichikawa, M.; Hosoe, Y.; Shiroishi, Y.; Sugita, Y. (American Institute of Physics (AIP), 1993)
http://dx.doi.org/10.1063/1.353534
Keywords: U