Hattori, K., Koji, Y., Fukuda, S., Ma, W., Okamoto, H., & Hamakawa, Y. (1993). Modulated photocarrier grating technique for diffusion length measurement in amorphous semiconductors. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationHattori, K., Y. Koji, S. Fukuda, W. Ma, H. Okamoto, and Y. Hamakawa. Modulated Photocarrier Grating Technique for Diffusion Length Measurement in Amorphous Semiconductors. [S.l.]: American Institute of Physics (AIP), 1993.
MLA (9th ed.) CitationHattori, K., et al. Modulated Photocarrier Grating Technique for Diffusion Length Measurement in Amorphous Semiconductors. American Institute of Physics (AIP), 1993.
Warning: These citations may not always be 100% accurate.