Charge trapping on different cuts of a single-crystalline α-SiO2 - Gong, H.; Le Gressus, C.; Oh, K. H.; Ding, X. Z.; Ong, C. K.; Tan, B. T. G. (American Institute of Physics (AIP), 1993)
http://dx.doi.org/10.1063/1.354778
Keywords: U