APA (7th ed.) Citation

Kim, D. H., Gray, K. E., Hettinger, J. D., Kang, J. H., & Choi, S. S. (1994). Resistive measurement of the temperature dependence of the penetration depth of Nb in Nb/AlOx/Nb Josephson junctions. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Kim, D. H., K. E. Gray, J. D. Hettinger, J. H. Kang, and S. S. Choi. Resistive Measurement of the Temperature Dependence of the Penetration Depth of Nb in Nb/AlOx/Nb Josephson Junctions. [S.l.]: American Institute of Physics (AIP), 1994.

MLA (9th ed.) Citation

Kim, D. H., et al. Resistive Measurement of the Temperature Dependence of the Penetration Depth of Nb in Nb/AlOx/Nb Josephson Junctions. American Institute of Physics (AIP), 1994.