Active microlevers as miniature torque magnetometers
Rossel, C. ; Bauer, P. ; Zech, D. ; Hofer, J. ; Willemin, M. ; Keller, H.
[S.l.] : American Institute of Physics (AIP)
Published 1996
[S.l.] : American Institute of Physics (AIP)
Published 1996
| ISSN: |
1089-7550
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|---|---|
| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
An extremely sensitive miniature torque magnetometer using Si p-doped piezoresistive cantilevers is described. The magnetization m↘ of very small magnetic or superconducting samples (≤1 μg) deposited on the cantilever can be measured via the torque τ↘=m↘×B↘ produced on them by an applied field B. The high resolution in the lever deflection of the order of 0.1 A(ring) corresponds to a torque sensitivity of the order of Δτ(approximately-equal-to)10−14 Nm. In a homogeneous field of 1 T this device allows magnetic moments as small as Δm(approximately-equal-to)10−14 Am2 to be measured, a value far smaller than that measurable by the best commercial superconducting quantum interference device magnetometers. Measurements performed on microcrystals of the high-Tc superconductors Bi2Sr2Ca1Cu2O8 and Hg1Ba2Ca3Cu4O10 in the static and dynamic modes demonstrate the excellent performance of this device at low temperature and in magnetic fields ranging between a few mT and 5 T. © 1996 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |