Yajima, Y., Takahashi, Y., Kuroda, K., & Sugita, Y. (1996). Sensitive detection of magnetic field distribution using scanning interference electron microscope (invited) (abstract): The 40th annual conference on magnetism and magnetic materials. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationYajima, Y., Y. Takahashi, K. Kuroda, and Y. Sugita. Sensitive Detection of Magnetic Field Distribution Using Scanning Interference Electron Microscope (invited) (abstract): The 40th Annual Conference on Magnetism and Magnetic Materials. [S.l.]: American Institute of Physics (AIP), 1996.
MLA (9th ed.) CitationYajima, Y., et al. Sensitive Detection of Magnetic Field Distribution Using Scanning Interference Electron Microscope (invited) (abstract): The 40th Annual Conference on Magnetism and Magnetic Materials. American Institute of Physics (AIP), 1996.