Cao, X. A., Hu, H. T., Dong, Y., Ding, X. M., & Hou, X. Y. (1999). The structural, chemical, and electronic properties of a stable GaS/GaAs interface. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationCao, X. A., H. T. Hu, Y. Dong, X. M. Ding, and X. Y. Hou. The Structural, Chemical, and Electronic Properties of a Stable GaS/GaAs Interface. [S.l.]: American Institute of Physics (AIP), 1999.
MLA (9th ed.) CitationCao, X. A., et al. The Structural, Chemical, and Electronic Properties of a Stable GaS/GaAs Interface. American Institute of Physics (AIP), 1999.
Warning: These citations may not always be 100% accurate.