Defects in ZnSe/ZnTe multiple quantum well-based pseudo-ohmic contacts to p-ZnSe - Tomiya, S.; Kijima, S.; Okuyama, H.; Tsukamoto, H.; Hino, T.; Taniguchi, S.; Noguchi, H.; Kato, E.; Ishibashi, A. (American Institute of Physics (AIP), 1999)
http://dx.doi.org/10.1063/1.371269
Keywords: U