Khapikov, A. F., Harrell, J. W., Fujiwara, H., & Hou, C. (2000). Temperature dependence of exchange field and coercivity in polycrystalline NiO/NiFe film with thin antiferromagnetic layer: Role of antiferromagnet grain size distribution. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationKhapikov, A. F., J. W. Harrell, H. Fujiwara, and C. Hou. Temperature Dependence of Exchange Field and Coercivity in Polycrystalline NiO/NiFe Film with Thin Antiferromagnetic Layer: Role of Antiferromagnet Grain Size Distribution. [S.l.]: American Institute of Physics (AIP), 2000.
MLA (9th ed.) CitationKhapikov, A. F., et al. Temperature Dependence of Exchange Field and Coercivity in Polycrystalline NiO/NiFe Film with Thin Antiferromagnetic Layer: Role of Antiferromagnet Grain Size Distribution. American Institute of Physics (AIP), 2000.