APA (7th ed.) Citation

Viera, G., Huet, S., & Boufendi, L. (2001). Crystal size and temperature measurements in nanostructured silicon using Raman spectroscopy. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Viera, G., S. Huet, and L. Boufendi. Crystal Size and Temperature Measurements in Nanostructured Silicon Using Raman Spectroscopy. [S.l.]: American Institute of Physics (AIP), 2001.

MLA (9th ed.) Citation

Viera, G., et al. Crystal Size and Temperature Measurements in Nanostructured Silicon Using Raman Spectroscopy. American Institute of Physics (AIP), 2001.