Evidence by Raman spectroscopy and x-ray diffraction of a strong influence of H2O traces on the metalorganic vapor phase epitaxy of GaAs on Si - Freundlich, A.; Leycuras, A.; Grenet, J. C.; Vèrié, C.; Huong, Pham V. (American Institute of Physics (AIP), 1987)
http://dx.doi.org/10.1063/1.98676
Keywords: U