Strain-induced confinement of carriers to quantum wires and dots within an InGaAs-InP quantum well - Kash, K.; Bhat, R.; Mahoney, Derek D.; Lin, P. S. D.; Scherer, A.; Worlock, J. M.; Van der Gaag, B. P.; Koza, M.; Grabbe, P. (American Institute of Physics (AIP), 1989)
http://dx.doi.org/10.1063/1.102266
Keywords: U