High-temperature x-ray diffraction analysis for Bi2Sr2CaCu2Oy - Hasegawa, T.; Kitamura, T.; Kobayashi, H.; Kumakura, H.; Kitaguchi, H.; Togano, K. (American Institute of Physics (AIP), 1992)
http://dx.doi.org/10.1063/1.106875
Keywords: U