APA (7th ed.) Citation

Smith, A. R., Chao, K., Shih, C. K., Shih, Y. C., & Streetman, B. G. (1995). Cross-sectional scanning tunneling microscopy study of GaAs/AlAs short period superlattices: The influence of growth interrupt on the interfacial structure. American Institute of Physics (AIP).

Chicago Style (17th ed.) Citation

Smith, A. R., Kuo-Jen Chao, C. K. Shih, Y. C. Shih, and B. G. Streetman. Cross-sectional Scanning Tunneling Microscopy Study of GaAs/AlAs Short Period Superlattices: The Influence of Growth Interrupt on the Interfacial Structure. Woodbury, NY: American Institute of Physics (AIP), 1995.

MLA (9th ed.) Citation

Smith, A. R., et al. Cross-sectional Scanning Tunneling Microscopy Study of GaAs/AlAs Short Period Superlattices: The Influence of Growth Interrupt on the Interfacial Structure. American Institute of Physics (AIP), 1995.