Carrier lifetimes in dielectric cap disordered GaAs/AlGaAs multiple quantum well with SiN capping layers - Choi, W. J.; Lee, S.; Kim, Y.; Woo, D.; Kim, S. K.; Kim, S. H.; Lee, J. I.; Kang, K. N.; Chu, J. H.; Yu, S. K.; Seo, J. C.; Kim, D.; et al. (American Institute of Physics (AIP), 1995)
http://dx.doi.org/10.1063/1.115272
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