Identification of first and second layer aluminum atoms in dilute AlGaAs using cross-sectional scanning tunneling microscopy - Smith, Arthur R.; Chao, Kuo-Jen; Shih, C. K.; Anselm, K. A.; Srinivasan, A.; Streetman, B. G. (American Institute of Physics (AIP), 1996)
http://dx.doi.org/10.1063/1.117415
Keywords: U