Identification of first and second layer aluminum atoms in dilute AlGaAs using cross-sectional scanning tunneling microscopy
Smith, Arthur R. ; Chao, Kuo-Jen ; Shih, C. K. ; Anselm, K. A. ; Srinivasan, A. ; Streetman, B. G.
Woodbury, NY : American Institute of Physics (AIP)
Published 1996
Woodbury, NY : American Institute of Physics (AIP)
Published 1996
| ISSN: |
1077-3118
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| Source: |
AIP Digital Archive
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| Topics: |
Physics
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| Notes: |
Cross-sectional scanning tunneling microscopy is used to study dilute AlxGa1−xAs with x=0.05 to investigate the bonding configurations within this ternary alloy. Atomically resolved scanning tunneling microscopy images combined with symmetry considerations provide the assignment of first and second layer aluminum atoms. The Al–Al pair distribution function based on the experimental data is compared with the theoretical pair distribution function of a random alloy. While there exists a qualitative agreement, small deviations from the ideal random distribution are also found. © 1996 American Institute of Physics.
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| Type of Medium: |
Electronic Resource
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| URL: |