Temperature effects on charge retention characteristics of integrated SrBi2(Ta,Nb)2O9 capacitors - Shimada, Y.; Nakao, K.; Inoue, A.; Azuma, M.; Uemoto, Y.; Fujii, E.; Otsuki, T. (American Institute of Physics (AIP), 1997)
http://dx.doi.org/10.1063/1.120110
Keywords: U