Binh, V. T., Purcell, S. T., Semet, V., & Feschet, F. (1998). Mapping of the magnetic leakage fields from nanoparticles by Fresnel projection microscopy. American Institute of Physics (AIP).
Chicago Style (17th ed.) CitationBinh, Vu Thien, S. T. Purcell, V. Semet, and F. Feschet. Mapping of the Magnetic Leakage Fields from Nanoparticles by Fresnel Projection Microscopy. Woodbury, NY: American Institute of Physics (AIP), 1998.
MLA (9th ed.) CitationBinh, Vu Thien, et al. Mapping of the Magnetic Leakage Fields from Nanoparticles by Fresnel Projection Microscopy. American Institute of Physics (AIP), 1998.
Warning: These citations may not always be 100% accurate.